[1] Cirac J I, Zoller P. Quantum computations with cold trapped ions [J]. Physical Review Letters, 1995, 74(20): 4091-4094.

[2] Wineland D J, Monroe C, Itano W M, et al. Experimental issues in coherent quantum-state manipulation of trapped atomic ions [J]. Journal of Research of the National Institute of Standards and Technology, 1998, 103(3): 259-328.

[3] Lucas D M, Keitch B C, Home J P, et al. A long-lived memory qubit on a low-decoherence quantum bus [OL]. http://arXiv:quant-ph/0710.4421v1, 2007.

[4] Leibfried D, Meekhof D M, Monroe C, et al. Experimental preparation and measurement of quantum states of motion of a trapped atom [J]. Journal of Modern Optics, 1997, 44(11-12): 2485-2505.

[5] Myerson A, Szwer D, Webster S, et al. High-fidelity readout of trapped-ion qubits [J]. Physical Review Letters, 2008, 100(20): 200502.

[6] Wan Wei, Chen Liang, Wu Haoyu, et al. Manipulation of ions in microscopic surface-electrode ion traps [J]. Chinese Physics Letters (中国物理快报), 2013, 30(7): 073701 (in Chinese).

[7] Blatt R. Towards fault-tolerant quantum computing with trapped ions [J]. Nature Physics, 2008, 4(6): 463-466.

[8] He Juan, Ding Zhiyong, Wu Tao, et al. Implementing quantum controlled phase gates with trapped ions [J]. Chinese Journal of Quantum Electronics(量子电子学报), 2011, 28(4): 429-433 (in Chinese).

[9] Turchette Q A, Kielpinski D, King B E, et al. Heating of trapped ions from the quantum ground state [J]. Physical Review A, 2000, 61(6): 276-282.

[10] Wang S X, Ge Y, Labaziewicz J, et al. Superconducting microfabricated ion traps [J]. Applied Physics Letters, 2010, 97(24): 244102.

[11] Hite D A, Colombe Y, Wilson A C, et al. 100-fold reduction of electric-field noise in an ion trap cleaned with in situ argon-ion-beam bombardment [J]. Physical Review Letters, 2012, 109(10): 103001.

[12] Deslauriers L, Olmschenk S, Stick D, et al. Scaling and suppression of anomalous heating in ion traps [J]. Physical Review Letters, 2006, 97(10): 103007.

[13] Safavinaini A, Rabl P, Weck P, et al. A microscopic model of electronic field noise heating in ion traps [J]. Physical Review A, 2011, 84(2): 023412.

[14] Henkel C, Horovitz B. Noise from metallic surfaces-effects of charge diffusion [J]. Physical Review A, 2007, 78(4): 042902.

[15] Henkel C, Ptting S, Wilkens M. Loss and heating of particles in small and noisy traps [J]. Applied Physics B, 1999, 69(5): 379-387.

[16] Ji Weibang, Cheng Huadong, Liu Liang. Ion heating by thermal noise of planar grooved ion chip [J]. Acta Optica Sinica(光学学报), 2012, 32(10): 259-263 (in Chinese).

[17] Kumph M, Henkel C, Rabl P, et al. Electric-field noise above a thin dielectric layer on metal electrodes [J]. New Journal of Physics, 2016, 18(2): 023020.

[18] Agarwal G S. Quantum electrodynamics in the presence of dielectrics and conductors. I. Electromagnetic-field response functions and black-body fluctuations in finite geometries [J]. Physical Review A, 1975, 11(1): 230-242.

[19] Tomas M S. Green function for multilayers: Light scattering in planar cavities [J]. Physical Review A, 1995, 51(3): 2545-2559.

[20] Mattis D C, Bardeen J. Theory of the anomalous skin effect in normal and superconducting metals [J]. Physical Review, 1958, 111(2): 412-417.

[21] Casalbuoni S, Knabbe E A, et al. Surface superconductivity in niobium for superconducting RF cavities [J]. Nuclear Instruments and Methods in Physics Research, 2004, 538(1-3): 45-64.

[22] Zhang B, Henkel C, Haller E, et al. Relevance of sub-surface chip layers for the lifetime of magnetically trapped atoms [J]. European Physical Journal D, 2005, 35(1): 97-104.

[23] Pronin A V, Dressel M, Pimenov A, et al. Direct observation of the superconducting energy gap in the conductivity spectra of thin Niobium films [J]. Physical Review B, 1998, 57(22): 14416-14420.

[24] Mcconnell R, Bruzewicz C, Chiaverini J, et al. Reduction of trapped ion anomalous heating by in situ surface plasma cleaning [J]. Physical Review A, 2015, 92(2): 020302.

[25] Emmenegger F P, Robinson M L A. Preparation and dielectric properties of niobium pentoxide crystals [J]. Journal of Physics and Chemistry of Solids, 1968, 29(9): 1673-1681.

[26] Brunner H R, Emmenegger F P, et al. Growth and properties of Nb2O5 thin film capacitors [J]. Journal of the Electrochemical Society, 1968, 115(12): 1287-1289.

[27] Halbritter J. On the oxidation and on the superconductivity of niobium [J]. Applied Physics A, 1987, 43(1): 1-28.