红外与激光工程, 2016, 45 (5): 0504001, 网络出版: 2016-06-12
红外焦平面低温形变测试方法及其误差分析
Measurement and error analysis of low temperature deformation of infrared focal plane arrays
引用该论文
张海燕, 管建安, 庄馥隆, 汪洋, 陈安森, 龚海梅. 红外焦平面低温形变测试方法及其误差分析[J]. 红外与激光工程, 2016, 45(5): 0504001.
Zhang Haiyan, Guan Jian′an, Zhuang Fulong, Wang Yang, Chen Ansen, Gong Haimei. Measurement and error analysis of low temperature deformation of infrared focal plane arrays[J]. Infrared and Laser Engineering, 2016, 45(5): 0504001.
张海燕, 管建安, 庄馥隆, 汪洋, 陈安森, 龚海梅. 红外焦平面低温形变测试方法及其误差分析[J]. 红外与激光工程, 2016, 45(5): 0504001. Zhang Haiyan, Guan Jian′an, Zhuang Fulong, Wang Yang, Chen Ansen, Gong Haimei. Measurement and error analysis of low temperature deformation of infrared focal plane arrays[J]. Infrared and Laser Engineering, 2016, 45(5): 0504001.