红外与激光工程, 2015, 44 (10): 2938, 网络出版: 2016-01-26  

红外瞄具温度应力可靠性检测系统研究

Temperature stress reliability testing system for infrared aiming device
作者单位
1 长春理工大学光电工程学院,吉林 长春 130022
2 长春大学电子信息工程学院,吉林 长春 130022
3 北方光电股份有限公司,陕西 西安 710065
引用该论文

柳鸣, 李丹妮, 张国玉, 孙向阳, 赵昭, 段洁. 红外瞄具温度应力可靠性检测系统研究[J]. 红外与激光工程, 2015, 44(10): 2938.

Liu Ming, Li Danni, Zhang Guoyu, Sun Xiangyang, Zhao Zhao, Duan Jie. Temperature stress reliability testing system for infrared aiming device[J]. Infrared and Laser Engineering, 2015, 44(10): 2938.

参考文献

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柳鸣, 李丹妮, 张国玉, 孙向阳, 赵昭, 段洁. 红外瞄具温度应力可靠性检测系统研究[J]. 红外与激光工程, 2015, 44(10): 2938. Liu Ming, Li Danni, Zhang Guoyu, Sun Xiangyang, Zhao Zhao, Duan Jie. Temperature stress reliability testing system for infrared aiming device[J]. Infrared and Laser Engineering, 2015, 44(10): 2938.

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