中国激光, 2006, 33 (suppl): 395, 网络出版: 2006-04-21  

激光电子散斑技术在集成电路封装热可靠性研究中的应用

Application of Electronic Speckle Pattern Interferometry in Heat Reliability Research on Very Large Scale Integration Package
作者单位
桂林电子工业学院电子工程系, 广西 桂林 541004
引用该论文

熊显名, 胡放荣, 李根. 激光电子散斑技术在集成电路封装热可靠性研究中的应用[J]. 中国激光, 2006, 33(suppl): 395.

熊显名, 胡放荣, 李根. Application of Electronic Speckle Pattern Interferometry in Heat Reliability Research on Very Large Scale Integration Package[J]. Chinese Journal of Lasers, 2006, 33(suppl): 395.

参考文献

[1] Tian Mingbo. Electroni Package Engineering [M]. Beijing: Tsinghua University Press, 2003. 614~619
田民波. 电子封装工程 [M]. 北京: 清华大学出版社, 2003. 614~619

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熊显名, 胡放荣, 李根. 激光电子散斑技术在集成电路封装热可靠性研究中的应用[J]. 中国激光, 2006, 33(suppl): 395. 熊显名, 胡放荣, 李根. Application of Electronic Speckle Pattern Interferometry in Heat Reliability Research on Very Large Scale Integration Package[J]. Chinese Journal of Lasers, 2006, 33(suppl): 395.

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