Photonics Research, 2020, 8 (11): 11001808, Published Online: Oct. 30, 2020   

High-speed dual-view band-limited illumination profilometry using temporally interlaced acquisition Download: 658次

Author Affiliations
Centre Énergie Matériaux Télécommunications, Institut National de la Recherche Scientifique, 1650 boulevard Lionel-Boulet, Varennes, Québec J3X1S2, Canada
Figures & Tables

Fig. 1. Operating principle of TIA–BLIP. (a) System schematic. (b) Timing diagram and acquisition sequence. te, camera’s exposure time.

下载图片 查看原文

Fig. 2. Coordinate-based 3D point determination algorithm. (a) Flowchart of the algorithm. (um,vm), coordinates of the point to be matched for the main camera; (x,y,z), recovered 3D coordinates. (b) Illustrative data of the intensity matching condition. ΔIm=I0(um,vm)I1(um,vm); ΔIep, intensity profile of I3I2 along the epipolar line. (c) Illustrative data of the quality map constraint and the transformation constraint. (ue,ve), coordinates of the estimated corresponding point for the auxiliary camera. (d) Illustrative data of the phase sign constraint. (e) Scheme for penalty score calculation and phase unwrapping. ri, horizontal distance between the candidates and the estimated corresponding point; ωm, phase value of the selected point in the main camera calculated by the Fourier transform profilometry method; ωai, phase value of the candidate points in the auxiliary camera calculated by the Fourier transform profilometry method; φai, phase value calculated by the phase-shifting method; φpi, phase value determined on the projector’s plane; Pi, 3D points determined by candidates; Pm, principal point of the main camera; and Pa, principal point of the auxiliary camera.

下载图片 查看原文

Fig. 3. Quantification of TIA–BLIP’s depth resolution. (a) 3D images of the planar surfaces (top image) and measured depth difference (bottom plot) at four exposure times. The white boxes represent the selected regions for analysis. (b) Relation between measured depth differences and their corresponding exposure times.

下载图片 查看原文

Fig. 4. TIA–BLIP of static 3D objects. (a) Reconstructed results of letter toys. Two perspective views are shown in the top row. Selected depth profiles (marked by the white dashed lines in the top images) and close-up views are shown in the bottom row. (b) Two perspective views of the reconstruction results of three toy cubes.

下载图片 查看原文

Fig. 5. TIA–BLIP of dynamic objects. (a) Reconstructed 3D images of a moving hand at five time points. (b) Movement traces of four fingertips [marked in the first panel in (a)]. (c) Front view of the reconstructed 3D image of the bouncing balls at five different time points. (d) Evolution of 3D positions of the three balls [marked in the third panel in (c)].

下载图片 查看原文

Fig. 6. TIA–BLIP of sound-induced vibration on glass. (a) Schematic of the experimental setup. The field of view is marked by the red dashed box. (b) Four reconstructed 3D images of the cup driven by a 500-Hz sound signal. (c) Evolution of the depth change of five points marked in the first panel of (b) with the fitted result. (d) Evolution of the averaged depth change with the fitted results under the driving frequencies of 490 Hz, 500 Hz, and 510 Hz. Error bar: standard deviation of Δz calculated from the five selected pixels. (e) Response of the depth displacements to sound frequencies. The cyan curve is a fitted result of a Lorentz function.

下载图片 查看原文

Fig. 7. TIA–BLIP of glass breakage. (a) Six reconstructed 3D images showing a glass cup broken by a hammer. (b) Evolution of 3D velocities of four selected fragments marked in the fourth and fifth panels in (a). (c) Evolution of the corresponding 3D accelerations of the four selected fragments.

下载图片 查看原文

Cheng Jiang, Patrick Kilcullen, Yingming Lai, Tsuneyuki Ozaki, Jinyang Liang. High-speed dual-view band-limited illumination profilometry using temporally interlaced acquisition[J]. Photonics Research, 2020, 8(11): 11001808.

本文已被 2 篇论文引用
被引统计数据来源于中国光学期刊网
引用该论文: TXT   |   EndNote

相关论文

加载中...

关于本站 Cookie 的使用提示

中国光学期刊网使用基于 cookie 的技术来更好地为您提供各项服务,点击此处了解我们的隐私策略。 如您需继续使用本网站,请您授权我们使用本地 cookie 来保存部分信息。
全站搜索
您最值得信赖的光电行业旗舰网络服务平台!