碲锌镉材料(CdZnTe)是目前探测X射线和γ射线的最好材料之一。将241Am和137Cs辐射源作用于像素CdZnTe探测器，通过实验和仿真分别得到能量谱估计、能量分辨率和峰值效率。由实验和仿真结果得出:在662 keV的高能量下，厚度较大的CdZnTe探测器可获得更高的能量分辨率和峰值效率，但在59.5 keV低能处会出现拖尾升高和电荷损失的现象;厚度较薄的探测器在低能处的特性反而更好。

Cadmium zinc telluride (CZT) is one of the preferred materials for the fabrication of X-ray and gamma-ray detector. The purpose of this work was to evaluate limitations of pixellated CdZnTe detector’s thickness used under different photon energy and find the best possible compromise for different detector thicknesses. Simulations and experimental investigations of the energy spectrum, energy resolution and photopeak efficiency measured by pixellated CdZnTe detectors have been performed using 241Am and 137Cs irradiation sources. It is concluded that thick CdZnTe provides high energy resolution and photopeak efficiency for high energy of 662 keV, but it suffers from increased tailing and charge loss for low energy of 59.5 keV; while thin devices can provide better performance.