Chinese Optics Letters, 2016, 14 (8): 083401, Published Online: Aug. 3, 2018
Interface characterization of Mo/Si multilayers 
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Basic Information
| DOI: | 10.3788/COL201614.083401 |
| 中图分类号: | -- |
| 栏目: | X-Ray Optics |
| 项目基金: | This work was supported by the International Science & Technology Cooperation Program of China (No. 2012DFG51590) and the National Natural Science Foundation of China (No. 11304328). |
| 收稿日期: | Mar. 2, 2016 |
| 修改稿日期: | -- |
| 网络出版日期: | Aug. 3, 2018 |
| 通讯作者: | Hongbo He (hbhe@siom.ac.cn) |
| 备注: | -- |
Jiaoling Zhao, Hongbo He, Hu Wang, Kui Yi, Bin Wang, Yun Cui. Interface characterization of Mo/Si multilayers[J]. Chinese Optics Letters, 2016, 14(8): 083401.
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