强激光与粒子束, 2018, 30 (4): 045003, 网络出版: 2018-05-04   

大型LTD装置功率源可靠性初步分析

Reliability of large LTD device analysis
计策 1,2,3周良骥 2,3焦健 4任福纯 4陈林 2,3蒋吉昊 2,3赵越 2,3
作者单位
1 中国工程物理研究院 流体物理研究所, 四川 绵阳 621999
2 中国工程物理研究院 研究生院, 北京 100088
3 中国工程物理研究院 脉冲功率科学与技术重点实验室, 四川 绵阳 621999
4 北京航空航天大学 可靠性与系统工程学院, 北京 100083
摘要
产生脉冲电流约50 MA的大型LTD装置功率源由数十万个电容器、开关和触发器组成。规模庞大的功率源采用串联系统可靠性模型,其可靠度想要达到一个较高的水平,存在所要求的开关可靠度难以实现的情况。大型LTD装置功率源的主要故障模式为开关自击穿和触发器故障,开关自击穿将导致其所在的模块故障,而触发器一对多的触发方式,使其故障时引起更多的模块故障。在LTD装置输出性能满足要求的前提下,允许存在一定数量的模块故障,并且控制故障模块分布,是实现功率源高可靠度的关键。基于概念设计的大型LTD装置功率源构成框架,分别建立了在功率源、支路、分层上控制故障模块数量的可靠性模型。采用蒙特卡罗方法对该模型进行仿真计算,得出了在给定的功率源可靠度条件下开关和触发器需要达到的可靠度。为实现该可靠性模型,使故障模块不对其他部分产生影响,还对故障模块隔离技术进行了分析。
Abstract
A large LTD device capable of delivering about 50 MA pulsed current to load consists of hundreds of thousands of capacitors, switches and trigger units. To achieve high reliability of such an enormous system is quite difficult with the series system reliability model, the required reliability of each switch is almost impossible to realize. The main fault modes of LTD device are switch prefire and trigger unit fault. The switch prefire will result in the failure of the LTD cavity where the prefire occurs. The fault of trigger unit would affect more LTD cavities because one trigger unit triggers several LTD cavities. The key to achieve high reliability level and meet the required performance, it is key that some fault LTD cavities are allowed and the number of fault LTD cavities is limited in different place. In this paper a reliability model of the LTD system is built from a conceptual design of the LTD device. The number of the fault LTD cavities would be strictly limited in the system, module and layer in the reliability model. For a given system reliability, the reliability values of switch and trigger unit are calculated by Monte-Carlo method. The method of fault isolation is also analyzed.
参考文献

[1] Weinbrecht E A, Bloomquist D H, Mcdaniel D H, et al. Status of the Z refurbishment project (ZR) at Sandia National Laboratories[C]//Proceedings of 15th IEEE International Pulsed Power Conference. 2005: 170-173.

[2] Dennis J A, Daniel B. ZR reliability and operations analysis[C]//Proceedings of 14th IEEE International Pulsed Power Conference. 2003: 183-186.

[3] Bartsch R R. ATLAS reliability analysis[C]//Proceedings of 10th IEEE International Pulsed Power Conference. 1995: 417-422.

[4] 丰树平, 李洪涛, 曹文彬, 等. Z箍缩实验装置高电压低抖动Marx发生器[J]. 强激光与粒子束, 2009, 21(1): 152-156. (Feng Shuping, Li Hongtao, Cao Wenbin, et al. High voltage low jitter Marx generator of prototype module of primary test stand. High Power Laser and Particle Beams, 2009, 21(1): 152-156)

[5] 李洪涛, 王玉娟, 丰树平, 等. 4 MV激光触发多级多通道开关特性[J]. 强激光与粒子束, 2007, 19(11): 1923-1926. (Li Hongtao, Wang Yujuan, Feng Shuping, et al. Switching property of 4 MV laser-triggered multistage switch. High Power Laser and Particle Beams, 2007, 19(11): 1923-1926)

[6] 夏明鹤, 王勐, 王玉娟, 等. 4 MV同轴-三平板型水介质自击穿开关设计[J]. 强激光与粒子束, 2006, 18(3): 496-500. (Xia Minghe, Wang Meng, Wang Yujuan, et al. Design of 4 MV coaxial-triplate water pulse forming line switch. High Power Laser and Particle Beams. 2006, 18(3): 496-500)

[7] 曾声奎. 可靠性设计与分析[M]. 北京: 国防工业出版社. 2011: 66-71. (Zeng Shenkui, Reliability design and analysis. Beijing: National Denfense Industry Press, 2011: 66-71)

[8] Kim A A, Kovalchuk B M, Bastrilov A N, et al. 100 ns current rise time LTD stage[C]//Proceedings of 13th IEEE International Pulsed Power Conference. 2001: 1491-1494.

[9] Mazarakis M G, Fowler W E, Long F W, et al. High current fast LTD driver development in Sandia Laboratory[C]//Proceedings of 15th IEEE International Pulsed Power Conference. 2005: 390-393.

[10] Leckbee J, Maenchen J, Johnson D L, et al. Design, simulation, and fault analysis of a 6.5-MV LTD for flash X-ray radiopraphy[J]. IEEE Trans Plasma Sci, 2006, 34(5): 1888-1899.

[11] Stygar W A, Awe T J, Bailey J E, et al. Conceptual designs of two petawatt-class pulsed-power accelerators for high-energy-density-physics experiments[J]. Physical Review Special Topics-Accelerators and Beams, 2015, 18: 110401.

[12] 陈林, 蒋吉昊, 邹文康, 等. LTD串联装置中部分模块不工作时的输出性能[J]. 强激光与粒子束, 2016, 28: 045004. (Chen Lin, Jiang Jihao, Zou Wenkang, et al. Performance of 10-stage LTD generator with some malfunctioning stages. High Power Laser and Particle Beams, 2016, 28: 045004)

[13] 赵宇. 可靠性数据分析[M]. 北京: 国防工业出版社. 2011: 334-340. (Zhao Yu, Data analysis of reliability. Beijing: National Denfense Industry Press, 2011: 334-340)

计策, 周良骥, 焦健, 任福纯, 陈林, 蒋吉昊, 赵越. 大型LTD装置功率源可靠性初步分析[J]. 强激光与粒子束, 2018, 30(4): 045003. Ji Ce, Zhou Liangji, Jiao Jian, Ren Fuchun, Chen Lin, Jiang Jihao, Zhao Yue. Reliability of large LTD device analysis[J]. High Power Laser and Particle Beams, 2018, 30(4): 045003.

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