原子力显微镜(AFM)在光盘检测及其质量控制中的应用
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景蔚萱, 蒋庄德. 原子力显微镜(AFM)在光盘检测及其质量控制中的应用[J]. 光学 精密工程, 2003, 11(4): 368. 景蔚萱, 蒋庄德. [J]. Optics and Precision Engineering, 2003, 11(4): 368.