利用光谱趋势参数快速判定小麦粉DON等级的研究
吴威, 祖广鹏, 陈桂云, 徐剑宏, 陈坤杰. 利用光谱趋势参数快速判定小麦粉DON等级的研究[J]. 光谱学与光谱分析, 2020, 40(5): 1565.
WU Wei, ZU Guang-peng, CHEN Gui-yun, XU Jian-hong, CHEN Kun-jie. The Study on Quickly Determining DON Level in Wheat Flour by Trend Parameter of Spectra[J]. Spectroscopy and Spectral Analysis, 2020, 40(5): 1565.
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吴威, 祖广鹏, 陈桂云, 徐剑宏, 陈坤杰. 利用光谱趋势参数快速判定小麦粉DON等级的研究[J]. 光谱学与光谱分析, 2020, 40(5): 1565. WU Wei, ZU Guang-peng, CHEN Gui-yun, XU Jian-hong, CHEN Kun-jie. The Study on Quickly Determining DON Level in Wheat Flour by Trend Parameter of Spectra[J]. Spectroscopy and Spectral Analysis, 2020, 40(5): 1565.