Elliptically-bent crystal spectrograph for X-ray diagnosis of laser-produced plasmas

Xiancai Xiong; Xianxin Zhong; Shali Xiao; Guohong Yang; Jie Gao

Chinese Optics Letters, 2004, 2 (1): 0127, Published Online: Jun. 6, 2006

Elliptically-bent crystal spectrograph for X-ray diagnosis of laser-produced plasmas

论文大纲

Xiancai Xiong ^1,*Xianxin Zhong ¹Shali Xiao ¹Guohong Yang ²Jie Gao ¹

Author Affiliations

¹ Key Laboratory of Optoelectronic Technology and System, Chongqing University, Chongqing 400044

² Research Center of Laser Fusion, China Academy of Engineering Physics, Mianyang 621900

120.6200 spectrometers and spectroscopic instrumentation 040.7480 X-rays 350.5400 plasmas

Abstract

In order to measure spatially and temporarily resolved laser-produced plasma X-ray spectra in 0.2-2 nm region, a novel two-channel elliptically-bent crystal spectrograph has been developed. Dispersive elements are LiF, PET, Mica, and KAP crystals, which cover Bragg angles in the range of 30-67.5 degrees. Eccentricity and focal distance of twin ellipses are 0.9586 and 1350 mm, respectively. Spatially resolved spectrum is photographically recorded with an X-ray film or X-CCD camera in one channel, and temporarily resolved one is photographically recorded with an X-ray streak camera in another channel, thus spatially and temporarily resolved spectra can be simultaneously obtained. Spectral images were acquired with X-CCD and PET in SHENGUANG-II laser facility, and experimental results show that the spectral resolution of the spectrograph is about 0.002 nm.

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Xiancai Xiong, Xianxin Zhong, Shali Xiao, Guohong Yang, Jie Gao. Elliptically-bent crystal spectrograph for X-ray diagnosis of laser-produced plasmas[J]. Chinese Optics Letters, 2004, 2(1): 0127.

Elliptically-bent crystal spectrograph for X-ray diagnosis of laser-produced plasmas

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