中国激光, 2018, 45 (12): 1211002, 网络出版: 2019-05-09
基于激光诱导击穿光谱技术的铜铟镓硒纳米薄膜的分析探测研究 下载: 1153次
Analytical Investigation of Cu(In, Ga)Se2 Thin Films Using Laser Induced reakdown Spectroscopy Technology
引用该论文
修俊山, 刘世明, 王琨琨, 付圣贵, 汪涛, 刘云燕. 基于激光诱导击穿光谱技术的铜铟镓硒纳米薄膜的分析探测研究[J]. 中国激光, 2018, 45(12): 1211002.
Junshan Xiu, Shiming Liu, Kunkun Wang, Shenggui Fu, Tao Wang, Yunyan Liu. Analytical Investigation of Cu(In, Ga)Se2 Thin Films Using Laser Induced reakdown Spectroscopy Technology[J]. Chinese Journal of Lasers, 2018, 45(12): 1211002.
修俊山, 刘世明, 王琨琨, 付圣贵, 汪涛, 刘云燕. 基于激光诱导击穿光谱技术的铜铟镓硒纳米薄膜的分析探测研究[J]. 中国激光, 2018, 45(12): 1211002. Junshan Xiu, Shiming Liu, Kunkun Wang, Shenggui Fu, Tao Wang, Yunyan Liu. Analytical Investigation of Cu(In, Ga)Se2 Thin Films Using Laser Induced reakdown Spectroscopy Technology[J]. Chinese Journal of Lasers, 2018, 45(12): 1211002.