磁绝缘线振荡器阴极释气电离粒子模拟

董志伟; 孙会芳; 杨郁林; 杨温渊; 周前红; 张芳; 董烨

doi:doi:10.11884/hplpb201628.033023

强激光与粒子束, 2016, 28 (3): 033023, 网络出版: 2016-03-28

磁绝缘线振荡器阴极释气电离粒子模拟

Particle simulation technology of MILO cathode outgassing ionization

论文大纲

董志伟 ^*孙会芳杨郁林杨温渊周前红张芳董烨

作者单位

北京应用物理与计算数学研究所, 北京 100094

摘要

阴极释气电离产生的击穿现象是限制磁绝缘线振荡器(MILO)工作性能的一个可能因素，也是限制其重频运行的主要障碍。利用三维全电磁粒子模拟程序对高功率微波器件MILO中阴极释气电离现象的物理建模技术以及实现三维自洽运算所需的粒子模拟技术进行了分析研究。对不同相对释气率的情况进行了模拟计算，模拟计算结果表明，当释气率超过一定阈值时，电离导致的等离子体会使微波输出功率迅速下降。

Abstract

The commutation phenomena produced by cathode outgassing ionization is a possible factor limiting MILO’s work performance, and also is the main obstacle to the MILO’s repeat frequency. In this paper, the physical modeling technology for cathode outgassing ionization phenomena of the high-power microwave device MILO and the particle simulation techniques to achieve the desired three-dimensional self-consistent calculation are analyzed by three dimensional PIC code. According to the simulation and computing results of different relative outgassing rate, when the outgassing rate exceeds a certain threshold, the plasma caused by the ionization will make the microwave output power rapidly.

参考文献

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董志伟, 孙会芳, 杨郁林, 杨温渊, 周前红, 张芳, 董烨. 磁绝缘线振荡器阴极释气电离粒子模拟[J]. 强激光与粒子束, 2016, 28(3): 033023. Dong Zhiwei, Sun Huifang, Yang Yulin, Yang Wenyuan, Zhou Qianhong, Zhang Fang, Dong Ye. Particle simulation technology of MILO cathode outgassing ionization[J]. High Power Laser and Particle Beams, 2016, 28(3): 033023.

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