光谱学与光谱分析, 2009, 29 (1): 268, 网络出版: 2009-12-09  

X光电子谱辅助Raman光谱表征N含量对非晶金刚石薄膜的结构影响

XPS and Raman Spectral Analysis of Nitrogenated Tetrahedral Amorphous Carbon (ta-C:N) Films with Different Nitrogen Content
作者单位
哈尔滨工业大学 复合材料与结构研究所,黑龙江 哈尔滨 150080
引用该论文

陈旺寿, 朱嘉琦, 韩杰才, 田桂, 檀满林. X光电子谱辅助Raman光谱表征N含量对非晶金刚石薄膜的结构影响[J]. 光谱学与光谱分析, 2009, 29(1): 268.

CHEN Wang-shou, ZHU Jia-qi, HAN Jie-cai, TIAN Gui, TAN Man-lin. XPS and Raman Spectral Analysis of Nitrogenated Tetrahedral Amorphous Carbon (ta-C:N) Films with Different Nitrogen Content[J]. Spectroscopy and Spectral Analysis, 2009, 29(1): 268.

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陈旺寿, 朱嘉琦, 韩杰才, 田桂, 檀满林. X光电子谱辅助Raman光谱表征N含量对非晶金刚石薄膜的结构影响[J]. 光谱学与光谱分析, 2009, 29(1): 268. CHEN Wang-shou, ZHU Jia-qi, HAN Jie-cai, TIAN Gui, TAN Man-lin. XPS and Raman Spectral Analysis of Nitrogenated Tetrahedral Amorphous Carbon (ta-C:N) Films with Different Nitrogen Content[J]. Spectroscopy and Spectral Analysis, 2009, 29(1): 268.

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