Chinese Optics Letters, 2009, 7 (5): 05446, Published Online: May. 22, 2009
Measurement of absolute phase shift on reflection of thin films using white-light spectral interferometry
Basic Information
| DOI: | -- |
| 中图分类号: | -- |
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| 收稿日期: | Jul. 17, 2008 |
| 修改稿日期: | -- |
| 网络出版日期: | May. 22, 2009 |
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Hui Xue, Weidong Shen, Peifu Gu, Zhenyue Luo, Yueguang Zhang, Xu Liu. Measurement of absolute phase shift on reflection of thin films using white-light spectral interferometry[J]. Chinese Optics Letters, 2009, 7(5): 05446.
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