Chinese Optics Letters, 2009, 7 (5): 05446, Published Online: May. 22, 2009
Measurement of absolute phase shift on reflection of thin films using white-light spectral interferometry
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Hui Xue, Weidong Shen, Peifu Gu, Zhenyue Luo, Yueguang Zhang, Xu Liu. Measurement of absolute phase shift on reflection of thin films using white-light spectral interferometry[J]. Chinese Optics Letters, 2009, 7(5): 05446.
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