光电工程, 2013, 40 (6): 37, 网络出版: 2013-08-05
基于格莱姆-施密特正交化两步相移轮廓术
Two-step Phase-shifting Profilometry Based on Gram-Schmidt Orthonormalization
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周灿林, 司书春, 高成勇, 徐建强, 雷振坤. 基于格莱姆-施密特正交化两步相移轮廓术[J]. 光电工程, 2013, 40(6): 37.
ZHOU Canlin, SI Shuchun, GAO Chengyong, XU Jianqiang, LEI Zhenkun. Two-step Phase-shifting Profilometry Based on Gram-Schmidt Orthonormalization[J]. Opto-Electronic Engineering, 2013, 40(6): 37.
周灿林, 司书春, 高成勇, 徐建强, 雷振坤. 基于格莱姆-施密特正交化两步相移轮廓术[J]. 光电工程, 2013, 40(6): 37. ZHOU Canlin, SI Shuchun, GAO Chengyong, XU Jianqiang, LEI Zhenkun. Two-step Phase-shifting Profilometry Based on Gram-Schmidt Orthonormalization[J]. Opto-Electronic Engineering, 2013, 40(6): 37.