基于状态分析的电子系统抗辐射性能评估方法
韩峰, 刘钰, 王斌. 基于状态分析的电子系统抗辐射性能评估方法[J]. 强激光与粒子束, 2016, 28(8): 28084001.
Han Feng, Liu Yu, Wang Bin. Method for evaluating radiation harden performance of electronic system based on system status[J]. High Power Laser and Particle Beams, 2016, 28(8): 28084001.
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韩峰, 刘钰, 王斌. 基于状态分析的电子系统抗辐射性能评估方法[J]. 强激光与粒子束, 2016, 28(8): 28084001. Han Feng, Liu Yu, Wang Bin. Method for evaluating radiation harden performance of electronic system based on system status[J]. High Power Laser and Particle Beams, 2016, 28(8): 28084001.
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