Chinese Optics Letters, 2017, 15 (3): 030004, Published Online: Jul. 25, 2018
Refractive index measurement of dielectric samples using highly focused radially polarized light (Invited Paper) 
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Basic Information
| DOI: | 10.3788/COL201715.030004 |
| 中图分类号: | -- |
| 栏目: | Complex Optical Fields |
| 项目基金: | GLM and VMRB acknowledge CONACYT-México for the scholarship 353317 and 394565, respectively, which were given to them to do their graduate studies. |
| 收稿日期: | Oct. 27, 2016 |
| 修改稿日期: | -- |
| 网络出版日期: | Jul. 25, 2018 |
| 通讯作者: | Guadalupe López-Morales (lopezmg@cio.mx) |
| 备注: | -- |
Guadalupe López-Morales, Victor-Manuel Rico-Botero, Rafael Espinosa-Luna, Qiwen Zhan. Refractive index measurement of dielectric samples using highly focused radially polarized light (Invited Paper)[J]. Chinese Optics Letters, 2017, 15(3): 030004.
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