Chinese Optics Letters, 2017, 15 (3): 030004, Published Online: Jul. 25, 2018  

Refractive index measurement of dielectric samples using highly focused radially polarized light (Invited Paper) Download: 674次

Author Affiliations
1 GIPYS Laboratory, Centro de Investigaciones en Óptica, A. C., León, Gto 37150, México
2 Department of Electro-Optics and Photonics, University of Dayton, Dayton, OH 45469, USA
Figures & Tables

Fig. 1. Side view of a collimated illumination field focused into a sample.

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Fig. 2. Radial polarization state of light focused by an objective lens. For any azimuthal angle (φ), the electric field is always in the plane of incidence.

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Fig. 3. Theoretical images generated numerically. Incident beam: (a) x-linear and (b) radial polarization.

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Fig. 4. Schematic diagram for the polarimetric experimental setup.

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Fig. 5. Experimental intensity distributions on the exit pupil plane of the objective lens when the sample is illuminated by: (a) x-linear and (b) radial polarization. Symmetrical dark zones, highlighted by the dashed lines, appear as a consequence of light reaching the Brewster angle.

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Table1. Measurement Results of the Brewster Angle and the Refractive Index of a Sample by Polarimetry

   Incident polarization
ParameterReported valueTheoretical valuex-polarizedRadially polarized
θB56.65056.59056.349±1.27956.116±1.502
n1.5191.5161.504±0.0711.492±0.082

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Guadalupe López-Morales, Victor-Manuel Rico-Botero, Rafael Espinosa-Luna, Qiwen Zhan. Refractive index measurement of dielectric samples using highly focused radially polarized light (Invited Paper)[J]. Chinese Optics Letters, 2017, 15(3): 030004.

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