Refractive index measurement of dielectric samples using highly focused radially polarized light (Invited Paper)

Guadalupe López-Morales; Victor-Manuel Rico-Botero; Rafael Espinosa-Luna; Qiwen Zhan

doi:doi:10.3788/COL201715.030004

Chinese Optics Letters, 2017, 15 (3): 030004, Published Online: Jul. 25, 2018

Refractive index measurement of dielectric samples using highly focused radially polarized light (Invited Paper) Download： 674次

Guadalupe López-Morales ^1,*Victor-Manuel Rico-Botero ¹Rafael Espinosa-Luna ¹Qiwen Zhan ²

Author Affiliations

¹ GIPYS Laboratory, Centro de Investigaciones en Óptica, A. C., León, Gto 37150, México

² Department of Electro-Optics and Photonics, University of Dayton, Dayton, OH 45469, USA

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Guadalupe López-Morales, Victor-Manuel Rico-Botero, Rafael Espinosa-Luna, Qiwen Zhan. Refractive index measurement of dielectric samples using highly focused radially polarized light (Invited Paper)[J]. Chinese Optics Letters, 2017, 15(3): 030004.

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