光学学报, 2016, 36 (12): 1234001, 网络出版: 2016-12-14   

用于超热电子诊断的单色X射线成像技术

Monochromatic X-ray Imaging Technology for Diagnostics of Hot Electrons
作者单位
中国工程物理研究院激光聚变研究中心等离子体物理重点实验室, 四川 绵阳 621900
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张强强, 魏来, 杨祖华, 钱凤, 陈勇, 曹磊峰. 用于超热电子诊断的单色X射线成像技术[J]. 光学学报, 2016, 36(12): 1234001.

Zhang Qiangqiang, Wei Lai, Yang Zuhua, Qian Feng, Chen Yong, Cao Leifeng. Monochromatic X-ray Imaging Technology for Diagnostics of Hot Electrons[J]. Acta Optica Sinica, 2016, 36(12): 1234001.

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张强强, 魏来, 杨祖华, 钱凤, 陈勇, 曹磊峰. 用于超热电子诊断的单色X射线成像技术[J]. 光学学报, 2016, 36(12): 1234001. Zhang Qiangqiang, Wei Lai, Yang Zuhua, Qian Feng, Chen Yong, Cao Leifeng. Monochromatic X-ray Imaging Technology for Diagnostics of Hot Electrons[J]. Acta Optica Sinica, 2016, 36(12): 1234001.

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