光学学报, 1990, 10 (4): 369, 网络出版: 2007-11-12
光学薄膜热膨胀系数的研究
Measurement of thermal expansion coefficients of optical thin films
摘要
光热位移偏转技术结合横向光热偏转技术可用于研究薄膜样品的热膨胀系数.本文以SiO2、TiO2、ZrO2、MgF2、ThF4等单层光学薄膜为例.报道相关的实验方法及实验结果.
Abstract
Thermal expansion coefficients of optical the films can be measured by means of the combination of photothermal displacement optical team deflection technique and transverse photothermal dcffection technique. In this paper, single layers of SiO2, TiO2, ZrO2, MgF2 and ThF4 are taken as examples to show the experimental methods and results.
参考文献
吴周令, 范正修. 光学薄膜热膨胀系数的研究[J]. 光学学报, 1990, 10(4): 369. 吴周令, 范正修. Measurement of thermal expansion coefficients of optical thin films[J]. Acta Optica Sinica, 1990, 10(4): 369.
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