光学学报, 1987, 7 (9): 832, 网络出版: 2011-09-20
计算多层膜电场分布的新矩阵方法
Calculation of electric fields inside multilayers by using a new thin-film characteristic matrix method
摘要
引入一种新的薄膜特征矩阵,用以计算多层膜中的电场分布,得到了TE和TM波电场的简单表达式。计算并绘制了薄膜偏振器和感应反射滤光片的内部电场分布曲线。应用新的薄膜特征矩阵,也可以很容易推导出多层膜的表面等离子激光波的色散关系。
Abstract
A new thin-film characteristic matrix, with which the relationship between the normal component of D and the tangential compo ent of E for TM wave of between the normal component of B and the tangential component of H for TE wave at the two boundaries of a layer can be described, is presented and used for calculation of electric field distributions inside multilayers. As a consequence, very simple expressions for the electric fields of TM and TE waves at any angle of incidence are obtained. The electric field distributions of a thin film polarizer and an induced reflection fi] k-r are calculated and plotted for illiustration of the new matrix method. It is also shown that the dispersive equation of surface polaritons on multilayers may easilybe derived by using this method.
参考文献
郑舒颖, 韩丽瑛. 计算多层膜电场分布的新矩阵方法[J]. 光学学报, 1987, 7(9): 832. ZHEN SHUYIN, HAN LITING. Calculation of electric fields inside multilayers by using a new thin-film characteristic matrix method[J]. Acta Optica Sinica, 1987, 7(9): 832.