双极型晶体管损坏与强电磁脉冲注入位置的关系
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周怀安, 杜正伟, 龚克. 双极型晶体管损坏与强电磁脉冲注入位置的关系[J]. 强激光与粒子束, 2006, 18(4): 689. 周怀安, 杜正伟, 龚克. Damage of bipolar junction transistor under electromagnetic pulse injected from different electrode[J]. High Power Laser and Particle Beams, 2006, 18(4): 689.