Influence of interface roughness on reflectivity of tungsten/boron-carbide multilayers with variable bi-layer number by X-ray reflection and diffuse scattering 
Download： 519次
Min Dai, Zhong Zhang, Jingtao Zhu, Xiaoqiang Wang, Jing Xu, Xiuhua Fu, Liang Bai, Qiushi Huang, Zhanshan Wang, Lingyan Chen. Influence of interface roughness on reflectivity of tungsten/boron-carbide multilayers with variable bi-layer number by X-ray reflection and diffuse scattering[J]. Chinese Optics Letters, 2009, 7(8): 08738.
[1] A. F. Jankowski, L. R. Schrawyer, and M. A. Wall, J. Appl. Phys. 68, 5162 (1990).
[2] J. F. Seely, G. Gutman, J. Wood, G. S. Herman, M. P. Kowalski, J. C. Rife, and W. R. Hunter, Appl. Opt. 32, 3541 (1993).
[3] D. L. Windt, E. M. Gullikson, and C. C. Walton, Opt. Lett. 27, 2212 (2002).
[4] F. Wang, Z. Wang, Z. Zhang, W. Wu, H. Wang, S. Zhang, S. Qin, and L. Chen, Opt. Precision Eng. (in Chinese) 13, 28 (2005).
[5] B. Ma, Z. Wang, H. Wang, F. Wang, W. Wu, Z. Zhang, S. Qin, and L. Chen, Act. Opt. Sin. (in Chinese) 25, 1581 (2005).
[6] Z. Zhang, Z. Wang, W. Wu, H. Wang, F. Wang, C. Gu, S. Qin, L. Chen, W. Hua, and Y. Huang, Nucl. Technol. (in Chinese) 28, 900 (2005).
[7] Z. Zhang, Z. Wang, J. Zhu, F. Wang, Y. Wu, S. Qin, and L. Chen, Chin. Phys. Lett. 23, 2678 (2005).
[8] Z. Zhang, Z. Wang, J. Zhu, Y. Wu, B. Mu, F. Wang, S. Qin, and L. Chen, Chin. Phys. Lett. 24, 3365 (2007).
[9] N. K. Pleshanov, Nucl. Instrum. Methods Phys. Res. A 524, 273 (2004).
[10] N. K. Pleshanov, N. G. Kolyvanova, S. V. Metelev, B. G. Peskov, V. M. Pusenkov, V. G. Syromyatnikov, V. A. Ul’yanov, and A. F. Schebetov, Phys. B 369, 234 (2005).
[11] J. Qin, J. Shao, K. Yi, and Z. Fan, Chin. Opt. Lett. 5, 301 (2006).
[12] E. Spiller, D. Stearns, and M. Krumrey, J. Appl. Phys. 74, 107 (1993).
[13] S. Zhang, J. Zhu, F. Wang, Z. Zhang, Z. Shen, Z. Wang, H. Zhou, and T. Huo, Opt. Instrum. (in Chinese) 28, 137 (2006).
Min Dai, Zhong Zhang, Jingtao Zhu, Xiaoqiang Wang, Jing Xu, Xiuhua Fu, Liang Bai, Qiushi Huang, Zhanshan Wang, Lingyan Chen. Influence of interface roughness on reflectivity of tungsten/boron-carbide multilayers with variable bi-layer number by X-ray reflection and diffuse scattering[J]. Chinese Optics Letters, 2009, 7(8): 08738.
PDF全文
