Influence of interface roughness on reflectivity of tungsten/boron-carbide multilayers with variable bi-layer number by X-ray reflection and diffuse scattering

Min Dai; Zhong Zhang; Jingtao Zhu; Xiaoqiang Wang; Jing Xu; Xiuhua Fu; Liang Bai; Qiushi Huang; Zhanshan Wang; Lingyan Chen

Chinese Optics Letters, 2009, 7 (8): 08738, Published Online: Aug. 17, 2009

Influence of interface roughness on reflectivity of tungsten/boron-carbide multilayers with variable bi-layer number by X-ray reflection and diffuse scattering Download： 519次

Min Dai ^1,2Zhong Zhang ¹Jingtao Zhu ¹Xiaoqiang Wang ¹Jing Xu ¹Xiuhua Fu ²Liang Bai ¹Qiushi Huang ¹Zhanshan Wang ¹Lingyan Chen ¹

Author Affiliations

¹ Institute of Precision Optical Engineering, Department of Physics, Tongji University, Shanghai 200092, China

² Department of Physics, Changchun University of Science and Technology, Changchun 130022, China

Figures & Tables

Min Dai, Zhong Zhang, Jingtao Zhu, Xiaoqiang Wang, Jing Xu, Xiuhua Fu, Liang Bai, Qiushi Huang, Zhanshan Wang, Lingyan Chen. Influence of interface roughness on reflectivity of tungsten/boron-carbide multilayers with variable bi-layer number by X-ray reflection and diffuse scattering[J]. Chinese Optics Letters, 2009, 7(8): 08738.

Influence of interface roughness on reflectivity of tungsten/boron-carbide multilayers with variable bi-layer number by X-ray reflection and diffuse scattering Download： 519次

关于本站 Cookie 的使用提示

全站搜索

Influence of interface roughness on reflectivity of tungsten/boron-carbide multilayers with variable bi-layer number by X-ray reflection and diffuse scattering Download： 519次

相关论文

相关资讯

关于本站 Cookie 的使用提示

全站搜索