Chinese Optics Letters, 2009, 7 (8): 08738, Published Online: Aug. 17, 2009
Influence of interface roughness on reflectivity of tungsten/boron-carbide multilayers with variable bi-layer number by X-ray reflection and diffuse scattering Download: 519次
多层膜 粗糙度 反射率 散射 310.0310 Thin films 220.0220 Optical design and fabrication 230.0230 Optical devices 340.0340 X-ray optics
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Min Dai, Zhong Zhang, Jingtao Zhu, Xiaoqiang Wang, Jing Xu, Xiuhua Fu, Liang Bai, Qiushi Huang, Zhanshan Wang, Lingyan Chen. Influence of interface roughness on reflectivity of tungsten/boron-carbide multilayers with variable bi-layer number by X-ray reflection and diffuse scattering[J]. Chinese Optics Letters, 2009, 7(8): 08738.