优化型多扫描方式原子力显微镜的研制
陈欢, 章海军, 张冬仙. 优化型多扫描方式原子力显微镜的研制[J]. 光电工程, 2013, 40(7): 16.
CHEN Huan, ZHANG Haijun, ZHANG Dongxian. Multi Scan Mode Atomic Force Microscope with Improved Properties and High Applicability[J]. Opto-Electronic Engineering, 2013, 40(7): 16.
[1] Binnig G, Rohrer H. Scanning tunneling microscope [J]. Helv.Phys.Acta(S0018-0238), 1982, 55: 726.
[2] Binning G, Quate C F, Gerber C. Atomic force microscope [J]. Phys.Rev.Lett(S0031-9007), 1986, 56(9): 930-933.
[3] 欧谷平, 宋珍, 桂文明, 等. LiBq4/ITO和 LiBq4/CuPc/ITO表面的 AFM与 XPS分析 [J].光电工程, 2004, 31(增 1): 124-126. OU Guping, SONG Zhen, GUI Wenming, et al. Surface analysis using AFM and XPS for LiBq4/ITO and LiBq4/CuPc/ITO [J]. Opto-Electronic Engineering, 2004, 31(S1): 124-126.
[4] Hansma P K, Drake B, Grigg D. A new optical-lever based atomic force microscope [J]. J.Appl.Phys(S0021-8979), 1994, 76(2): 796-799.
[5] Kwon J, Hong J, Kim Y S. Atomic force microscope with improved scan accuracy scan speed and optical vision [J]. Rev.Sci. Instrum(S0034-6748), 2003, 74(10): 4378-4383.
[6] ZHANG Haijun, ZHANG Dongxian, SHI Yang. A horizontal atomic force microscope and its applications [J]. Nanophototonics, Nanostructure, and Nanometrology(S0277-786X), 2005, 5635: 511-520.
[7] Georg Schitter, Karl J, Barry E. Design and Modeling of a High-Speed AFM-Scanner [J]. IEEE Transactions on Control Systems Technology(S1063-6536), 2007, 15(5): 906-915.
[8] XIE Zhigang, FU Xia, ZHANG Dongxia, et al. Study on a novel atomic force microscopy for the detection of large-size samples [J]. Acta Optica Sinica(S0253-2239), 2009, 29(s2): 327-330.
[9] DAI Gaoliang, Pohlenz F, Danzebrink H U. Metrological large range scanning probe microscope [J]. Rev. Sci. Instrum(S0034-6748), 2004, 75(4): 962-970.
陈欢, 章海军, 张冬仙. 优化型多扫描方式原子力显微镜的研制[J]. 光电工程, 2013, 40(7): 16. CHEN Huan, ZHANG Haijun, ZHANG Dongxian. Multi Scan Mode Atomic Force Microscope with Improved Properties and High Applicability[J]. Opto-Electronic Engineering, 2013, 40(7): 16.
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