光电工程, 2013, 40 (7): 16, 网络出版: 2013-08-01
优化型多扫描方式原子力显微镜的研制
Multi Scan Mode Atomic Force Microscope with Improved Properties and High Applicability
图 & 表
陈欢, 章海军, 张冬仙. 优化型多扫描方式原子力显微镜的研制[J]. 光电工程, 2013, 40(7): 16. CHEN Huan, ZHANG Haijun, ZHANG Dongxian. Multi Scan Mode Atomic Force Microscope with Improved Properties and High Applicability[J]. Opto-Electronic Engineering, 2013, 40(7): 16.