红外与激光工程, 2017, 46 (6): 0617004, 网络出版: 2017-07-10  

位置信息约束的SMT料盘X射线图像检测方法

Method for detecting the X-Ray images of SMT materials plates based on the constraints of position information
耿磊 1,2彭晓帅 1,2肖志涛 1,2李秀艳 1,2荣锋 1,2马潇 1,2
作者单位
1 天津市光电检测技术与系统重点实验室, 天津 300387
2 天津工业大学 电子与信息工程学院, 天津 300387
引用该论文

耿磊, 彭晓帅, 肖志涛, 李秀艳, 荣锋, 马潇. 位置信息约束的SMT料盘X射线图像检测方法[J]. 红外与激光工程, 2017, 46(6): 0617004.

Geng Lei, Peng Xiaoshuai, Xiao Zhitao, Li Xiuyan, Rong Feng, Ma Xiao. Method for detecting the X-Ray images of SMT materials plates based on the constraints of position information[J]. Infrared and Laser Engineering, 2017, 46(6): 0617004.

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耿磊, 彭晓帅, 肖志涛, 李秀艳, 荣锋, 马潇. 位置信息约束的SMT料盘X射线图像检测方法[J]. 红外与激光工程, 2017, 46(6): 0617004. Geng Lei, Peng Xiaoshuai, Xiao Zhitao, Li Xiuyan, Rong Feng, Ma Xiao. Method for detecting the X-Ray images of SMT materials plates based on the constraints of position information[J]. Infrared and Laser Engineering, 2017, 46(6): 0617004.

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