光学学报, 2000, 20 (11): 1533, 网络出版: 2006-08-09
原子力显微镜测试光学超光滑表面微轮廓的研究
Study on Testing Method for Microprofile of Optical Supersmooth Surface
微轮廓 超光滑光学表面 原子力显微镜 光学测试 microprofile optical supersmooth surface atomic force microscope (AFM) optical testing.
摘要
论述了使用原子力显微镜测量超光滑光学表面的优点及其在光学领域中的重要应用, 列举了用这种方法测试得到的超光滑光学表面微轮廓图及纳米量级的微缺陷, 以及这些表面镀膜前后表面形态结构和微粗糙度的变化。 作为比较, 列举了用干涉轮廓仪测得相同表面的微粗糙度参数等。 由于原子力显微镜有三维的高精度, 而干涉方法只有一维的高精度, 所以前者可以得出表面真实形貌和微轮廓。
Abstract
Some advantages and important application of the testing method for optical supersmooth surface using atomic force microscope (AFM) are discussed. Some testing results of microprofile and micro-defect with nonometer-grade for optical supersmooth surface using AFM method are presented, and the change of morphology and micro-roughness before and after coating of same surface is given. For comparison, testing results of micro-roughness parameters for same surface measured using interference profiler are presented too. It is indicated that AFM method has three-dimensional high-accuracy, but interference method has only one-dimensional, so the former can give true morphology and microprofile of surface.
李剑白, 李达成, 李小芸, 殷爱菡, 赵安庆. 原子力显微镜测试光学超光滑表面微轮廓的研究[J]. 光学学报, 2000, 20(11): 1533. 李剑白, 李达成, 李小芸, 殷爱菡, 赵安庆. Study on Testing Method for Microprofile of Optical Supersmooth Surface[J]. Acta Optica Sinica, 2000, 20(11): 1533.