We propose a wideband transverse magnetic-reflected polarizing film composed of Cr and SiO2. Based on the polarization characteristics of reflected light from Cr/SiO2 film, the film can serves as a polarizer to severely attenuate the transverse electric (TE)-polarized light and reflect the transverse magnetic (TM)-polarized light in a wavelength range from 600 to 900 nm. By suitably choosing the film thicknesses, the operation angles of such polarizers can be adjusted over a wide angle range greater than the critical angle of total reflection. Cr/SiO2 film has potential use in surface plasmon resonance (SPR) sensors based on Kretchmann configuration to form integrated structures.

This is a difficult kind of beam splitter in a cemented cube. The specification is: under angle of incidence (AOI)=55o, the reflectivity at 905 nm is no less than 85%, and in the visible range the average transmittance is 40+(-)2%, and T+R>=90%. Because the AOI is 55o, it needs to use a metal coating material to make sure the film be designed. The film has some problems on durability, and its optical performance is very hard to be controlled. We get some experiments after changing its design including coating material and evaporation technique. Final results show that the beam splitter has good properties, and passed temperature, and environmental durability.

Based on the photothermal detuning technique, the three linear relations among reflectance (or transmittance), temperature rise, and pump beam power are studied to achieve the absolute measurement of absorption loss. The relation between temperature and reflectance and the calculation accuracy of temperature rise on sample surface have great impacts on the measured result. The influences of parameters involved in the method and the relation between temperature and reflectance and the temperature model of sample surface are also studied. The results show that the absolute absorption loss of optical coatings can be achieved by the proposed method. The measurement accuracy depends on the temperature model and the relation between temperature and reflectance. The linear relation between reflectance and temperature rise has largest slope when probe beam wavelength is 632.8 nm and incident angle is 28o. The linear relation slope between temperature rise and pump beam power decreases with the growing of beam size and modulation frequency. The results provide theoretical and experimental supports for the perfection and further application of the photothermal detuning technique.

A different approach to construct dispersive mirrors (DMs) for ultrafast applications is proposed based on the high reflectivity and constant phase property of a novel metal in ultrawide spectral band. A 200-nm bandwidth DM, a high dispersive DM, and a complementary DM are designed with mixed metal multilayer dielectric stacks. The results show that the mixed-metal multilayer dielectric DMs (MMDMs) have much less layers and total thickness compared with an all-dielectric DM under the case of comparable performance. Such an approach will save manufacturing time and remarkably improve the stress of the DM.

An explicit model from the matrix method is utilized to describe the measurement sensitivity of the photothermal detuning technique dependent on the polarization of the probe beam. Numerical results show that the optimal probe wavelengths and the slope of the main spectral band edges are different for both s- and p-polarized beams with the same incident angle. Compared with the random polarized probe beam at the larger incident angle, the measurement sensitivity can be improved approximately twice over with the p- and s-polarized probe beams under the optimal condition.