Keding Yan 1,2,3Shouyu Wang 1,2,3Shu Jiang 4Liang Xue 5[ ... ]Zhenhua Li 1,2,3
Author Affiliations
Abstract
1 Department of Information Physics &
2 Engineering, Nanjing University of Science &
3 Technology, Nanjing 210094, China
4 704 Institute, China Shipbuilding Industry Corporation, Shanghai 200031, China
5 College of Electronic and Information Engineering, Shanghai University of Electric Power, Shanghai 200090, China
6 China North Vehicle Research Institute, Beijing 100072, China
7 Xi'an Modern Control Technology Institute, Xi'an 710065, China
A new criterion for target detection and identification is proposed to realize metal/dielectric identification and recognition based on Mueller matrix analysis. By using randomly rough surfaces as targets, numerical calculations are used to prove the robustness and accuracy of the criterion. Moreover, to the best of our knowledge, this is the first time to successfully explain the criterion by theoretical analysis. We believe the work provides an important reference for polarization imaging in laser radar and remote sensing, and so on.
290.5880 Scattering, rough surfaces 240.5770 Roughness 290.0290 Scattering 240.0240 Optics at surfaces 
Chinese Optics Letters
2014, 12(9): 092901
Author Affiliations
Abstract
A method of detecting dry, icy and wet road surface conditions based on scanning detection of single wavelength backward power is proposed in this letter. The detector is used to receive the backward scattered power which changes with the incidence angle. The relationship between backward power and incidence angle is used to find out the effective angle range and distinguish method. Experiment and simulation show that it is feasible to classify these three conditions within incidence angle of 5.3 degree.
080.1753 Computation methods 040.0040 Detectors 280.1350 Backscattering 290.5880 Scattering, rough surfaces 
Chinese Optics Letters
2014, 12(5): 050801
Author Affiliations
Abstract
A practicable experimental method for measuring scattering on rough surfaces is reported. The scattered patterns are captured on a screen composed of two pieces of ground glass and then imaged using a charge-coupled device. The scattered intensity profiles are extracted by converting the patterns in real space into the wave vector space. Isotropic and anisotropic samples of the rough backsides of silicon wafer are investigated respectively, and their intensity profiles are measured. The profiles of the anisotropic sample are obtained by reading the pixels on the specific orientation curves. The parameters of the samples are extracted using angle-resolved light-scattering schemes and theories. The results well agree with measurements obtained using an atomic force microscope.
290.5880 Scattering, rough surfaces 120.5820 Scattering measurements 120.6650 Surface measurements, figure 
Chinese Optics Letters
2012, 10(5): 052901
Author Affiliations
Abstract
Amorphous Si waveguides with gradient refractive index cladding structure are proposed and fabricated using plasma-enhanced chemical vapor deposition method. Compared with 6 dB/cm for ridge waveguide without gradient cladding, the propagation loss of the gradient cladding waveguides is less than 1 dB/cm with both TE and TM polarizations.
160.4670 Optical materials 230.7370 Waveguides 290.5880 Scattering, rough surfaces 310.6860 Thin films, optical properties 
Chinese Optics Letters
2012, 10(4): 041601
Author Affiliations
Abstract
School of Science, Xidian University, Xi'an 710071
The optical wave scattering from one-dimensional (1D) lossy dielectric Gaussian random rough surface is studied. The tapered incident wave is introduced into the classical Kirchhoff approximation (KA), and the shadowing effect is also taken into account to make the KA results have a high accuracy. The definition of the bistatic scattering coefficient of the modified KA and the method of moment (MOM) are unified. The characteristics of the optical wave scattering from the lossy dielectric Gaussian random rough surface of different parameters are analyzed by implementing MOM.
基尔霍夫近似 矩量法 光波散射 粗糙面 290.5880 Scattering, rough surfaces 290.0290 Scattering 240.0240 Optics at surfaces 
Chinese Optics Letters
2009, 7(3): 03259
Author Affiliations
Abstract
School of Science, Nanjing University of Science and Technology, Nanjing 210094
The depolarization behavior of backscattered linearly polarized light from ZnO thin film was investigated experimentally. The results show that the characteristics are related to both the polarization orientation and wavelength of linearly polarized incident light. When the incident light is s-polarized, the depolarization behaviors are different for different wavelengths. When the incident light is p-polarized, the depolarization behaviors, on the contrary, are similar for different wavelengths. In addition, there is an optimal incident angle for depolarization of linearly polarized light with different wavelengths, which is equal to their effective Brewster angles, respectively.
退偏振 线偏振光 ZnO薄膜 有效布鲁斯特角 290.5880 Scattering, rough surfaces 260.5430 Polarization 240.0240 Optics at surfaces 290.0290 Scattering 
Chinese Optics Letters
2007, 5(12): 720
Author Affiliations
Abstract
School of Electronics and Information Engineering, Xi'an Jiaotong University, Xi'an 710049
Reflectance model is a basic concept in computer vision. Some existing models combining the classical diffuse reflectance model and those for surfaces containing specular components can approximately describe real reflectance. But the ratio of diffuse and specular reflection decided manually has no clear meaning. We propose a new polynomial hybrid reflectance model. The reflectance map equation with a known shape (for example cylinder) as a sample is used to estimate parameters of the proposed reflectance model by least square regression algorithm. Then the reflectance parameters for surfaces of the same class of materials can be determined. Experiments are performed for a metal surface. The synthesis images produced by the proposed method and existing ones are compared with the real acquired image, and the results show that the proposed reflectance model is suitable for describing real reflectance.
反射模型 反射图 参数估计 最小二乘回归算法 100.2960 Image analysis 120.5820 Scattering measurements 160.4760 Optical properties 290.5820 Scattering measurements 290.5880 Scattering, rough surfaces 
Chinese Optics Letters
2007, 5(12): 683
Author Affiliations
Abstract
1 School of Science, Xidian University, Xi'an 710071
2 College of Physics and Electronic Information, Yan'an University, Yan'an 716000
The optical wave scattering from the slightly rough surface of three-layer medium is studied. The formulaes of the scattering coefficients for different polarizations are derived using the small perturbation method. A Gaussian rough surface is presented for describing rough surface of layered medium, the influence of the permittivity of layered medium, the mean layer thickness of intermediate medium, the surface roughness parameters and the incident wavelength on the bistatic scattering coefficient of HH polarization are obtained and discussed by numerical implementation.
高斯粗糙面 微扰法 分层介质 双站散射系数 290.5880 Scattering, rough surfaces 290.0290 Scattering 240.0240 Optics at surfaces 
Chinese Optics Letters
2007, 5(10): 605

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