With ultrafast laser systems reaching presently 10 PW peak power or operating at high repetition rates, research towards ensuring the long-term, trouble-free performance of all laser-exposed optical components is critical. Our work is focused on providing insight into the optical material behavior at fluences below the standardized laser-induced damage threshold (LIDT) value by implementing a simultaneous dual analysis of surface emitted particles using a Langmuir probe (LP) and the target current (TC). ${\mathrm{HfO}}_2$ and ${\mathrm{ZrO}}_2$ thin films deposited on fused silica substrates by pulsed laser deposition at various ${\mathrm{O}}_2$ pressures for defect and stoichiometry control were irradiated by Gaussian, ultrashort laser pulses (800 nm, 10 Hz, 70 fs) in a wide range of fluences. Both TC and LP collected signals were in good agreement with the existing theoretical description of laser–matter interaction at an ultrashort time scale. Our approach for an in situ LIDT monitoring system provides measurable signals for below-threshold irradiation conditions that indicate the endurance limit of the optical surfaces in the single-shot energy scanning mode. The LIDT value extracted from the LP-TC system is in line with the multipulse statistical analysis done with ISO 21254-2:2011(E). The implementation of the LP and TC as on-shot diagnostic tools for optical components will have a significant impact on the reliability of next-generation ultrafast and high-power laser systems.

损伤阈值测量装置是强激光技术的重要技术指标，主要用于强激光光学元件的研制和测试，而同步触发模块作为模块之间时序的控制器，是研制损伤阈值测量装置的关键技术之一。介绍了一种用于激光损伤阈值测量装置的同步触发模块及方法。设计了基于现场可编程门阵列（field programmable gate array，FPGA）为主控芯片的硬件方案，通过上位机操控软件设置同步触发参数，来控制各路输出同步信号的宽度和各路信号之间的时序，可极大提高同步触发的精度和效率。通过实验验证，同步脉冲信号之间的调节精度为2 ns，同步脉冲信号的最小宽度为10 ns，满足激光损伤阈值测量装置的要求。

近年来，随着大功率、高能量激光系统的不断发展，光学薄膜的抗激光能力成为制约激光系统高质量发展的瓶颈之一。基于不同的制备方法及工艺参数会对薄膜的损伤阈值产生重要的影响，就薄膜镀制前、镀制中以及镀制后三个方面对提高损伤阈值的方法进行综述，其中包括膜料优选、膜系设计、溶剂清洗、离子束清理、制备方法、离子束后处理、激光后处理等内容。

Multilayer dielectric gratings (MLDGs) are crucial for pulse compression in picosecond–petawatt laser systems. Bulged nodular defects, embedded in coating stacks during multilayer deposition, influence the lithographic process and performance of the final MLDG products. In this study, the integration of nanosecond laser conditioning (NLC) into different manufacturing stages of MLDGs was proposed for the first time on multilayer dielectric films (MLDFs) and final grating products to improve laser-induced damage performance. The results suggest that the remaining nodular ejection pits introduced by the two protocols exhibit a high nanosecond laser damage resistance, which remains stable when the irradiated laser fluence is more than twice the nanosecond-laser-induced damage threshold (nanosecond-LIDT) of the unconditioned MLDGs. Furthermore, the picosecond-LIDT of the nodular ejection pit conditioned on the MLDFs was approximately 40% higher than that of the nodular defects, and the loss of the grating structure surrounding the nodular defects was avoided. Therefore, NLC is an effective strategy for improving the laser damage resistance of MLDGs.