设计了一种外置光阑的针孔相机镜头，可免去传统方法复杂的相机标定过程，采用影像仪和三坐标测量机实现测量系统各元件空间位置的几何标定，并依靠相移算法实现屏幕与相机像素的精准匹配。实验结果表明，本文提出的偏折测量结果与干涉仪测试结果偏差优于20 nm RMS，可满足光学镜面加工研磨阶段到抛光阶段的过渡测量需求，为光学加工车间提供了可靠、经济、高效的面型评估，具有广泛的应用前景。

Diagnosing the evolution of laser-generated high energy density (HED) systems is fundamental to develop a correct understanding of the behavior of matter under extreme conditions. Talbot–Lau interferometry constitutes a promising tool, since it permits simultaneous single-shot X-ray radiography and phase-contrast imaging of dense plasmas. We present the results of an experiment at OMEGA EP that aims to probe the ablation front of a laser-irradiated foil using a Talbot–Lau X-ray interferometer. A polystyrene (CH) foil was irradiated by a laser of 133 J, 1 ns and probed with 8 keV laser-produced backlighter radiation from Cu foils driven by a short-pulse laser (153 J, 11 ps). The ablation front interferograms were processed in combination with a set of reference images obtained ex situ using phase-stepping. We managed to obtain attenuation and phase-shift images of a laser-irradiated foil for electron densities above ${10}^{22}\;{\mathrm{cm}}^{-3}$ . These results showcase the capabilities of Talbot–Lau X-ray diagnostic methods to diagnose HED laser-generated plasmas through high-resolution imaging.

Usually, a multilens optical system is composed of multiple undetectable sublenses. Wavefront of a multilens optical system cannot be measured when classical transmitted phase measuring deflectometry (PMD) is used. In this study, a wavefront measuring method for an optical system with multiple optics is presented based on PMD. A paraxial plane is used to represent the test multilens optical system. We introduce the calibration strategy and mathematical deduction of gradient equations. Systematic errors are suppressed with an N-rotation test. Simulations have been performed to demonstrate our method. The results showing the use of our method in multilens optical systems, such as the collimator and single-lens reflex camera lenses show that the measurement accuracy is comparable with those of interferometric tests.