1 香港理工大学生物医学工程学系，中国 香港
2 香港理工大学光子技术研究院，中国 香港
3 香港理工大学深圳研究院，广东 深圳 518063
基于多模光纤或多芯光纤的无透镜超细光纤内窥成像技术近些年获得了快速发展，有望成为下一代的极微创、高分辨率内窥显微镜。通过对相干入射光场的时空调控，该技术可克服多模光纤中模式色散或多芯光纤中相位畸变的影响，在无需光纤末端透镜或扫描器件的情况下实现高分辨率的聚焦、成像及相关应用。此外，在无透镜光纤内窥成像或图像传输等场景下，通过构建物理或深度学习模型，从光纤输出测量中也能实现物体信息重建。对相干光纤无透镜成像技术的发展进行综述，首先说明无透镜光纤成像的基础原理，并从主动波前调控和被动目标重建这两类角度阐述无透镜光纤成像方法，接着介绍一些先进光纤成像模态和技术，列举光纤成像相关应用，最后分析该领域所面临的挑战，总结并展望其进一步发展方向和应用前景。
多模光纤 多芯光纤 波前整形 内窥成像 光学显微成像 深度学习 激光与光电子学进展
2024, 61(6): 0618002
1 中国科学院西安光学精密机械研究所瞬态光学与光子技术国家重点实验室，陕西 西安 710119
2 中国科学院大学，北京 100049
将普通光学显微镜的均匀照明替换为光场具有空间结构分布的照明，可为显微镜增添超分辨和光切片的新功能。结构光照明显微（SIM）技术与传统宽场光学显微镜具有良好的结构兼容性，继承了传统光学显微镜非侵入、低光毒性、低荧光漂白、快速成像的优点。其高时空分辨率和三维光切片能力非常适合活体细胞或组织的观测，受到生物医学和光学界的持续关注。快速产生高对比度、高频率的结构光场并进行快速相移和旋转调控是SIM的核心技术。近年来基于数字微镜器件（DMD）调制的SIM（DMD-SIM）发展迅速，它利用DMD高刷新率、高光通量、偏振不敏感的优势，克服了传统器件如物理光栅和液晶空间光调制器在调控速度上的缺点。本综述首先介绍了SIM超分辨和光切片的基本原理，然后着重阐述了DMD-SIM通过光投影和光干涉产生结构光照明及调控光场的方法，对当前的DMD-SIM研究进展进行了归纳评述，总结了DMD-SIM的优缺点，最后对DMD-SIM面临的挑战和发展趋势进行了展望。
光学显微 结构光照明显微 超分辨 光切片 数字微镜器件 激光与光电子学进展
2024, 61(6): 0618001
中国科学技术大学物理学院光学与光学工程系，安徽 合肥 230026
光学薄膜广泛应用于光学仪器和测控技术中，充斥着我们生活的方方面面，使我们的生活更加丰富多彩。不同于常规的光学薄膜应用场景，本综述重点介绍如何将光学薄膜与光学显微成像结合起来。研究方案主要是：基于负载表面等离子体波的贵金属薄膜、具有光子带隙结构的介质多层薄膜，研制出应用于无标记显微探测的平面薄膜光子元件。得益于其平面结构特性与成熟的制作工艺，该类薄膜光子元件可兼容常规明场、宽场显微成像系统，可以作为被测样品的衬底或成像系统的插件。借助于薄膜与光波的近-远场相互作用特性，该器件可以调控系统的照明光场，如实现暗场照明、全内反射照明、边缘增强照明等。通过照明方式的改变，提升成像的对比度、探测灵敏度，进而发展出多模式、高灵敏度、高对比度、无标记光学显微成像与传感系统。为充分发挥该系统结构简单、宽场、高灵敏度、无标记成像的特点，将其应用于环境光子学领域，实现了真实大气环境中单个超细颗粒物吸湿增长过程的原位、实时、无损表征，有望为大气雾霾溯源与追因研究提供有力的科学支撑和技术工具。
薄膜光场调控，介质多层薄膜 贵金属薄膜 无标记显微探测 大气超细颗粒物 激光与光电子学进展
2024, 61(6): 0618012
Author Affiliations
Abstract
1 Harbin Institute of Technology (Shenzhen), School of Science, Ministry of Industry and Information Technology Key Lab of Micro-Nano Optoelectronic Information System, Shenzhen, China
2 Peking University, School of Physics, State Key Laboratory for Mesoscopic Physics and Frontiers Science Center for Nano-Optoelectronics, Beijing, China
3 Nanjing University of Science and Technology, Institute of Interdisciplinary Physical Sciences, School of Science, Nanjing, China
4 Shanxi University, Collaborative Innovation Center of Extreme Optics, Taiyuan, China
5 Peking University Yangtze Delta Institute of Optoelectronics, Nantong, China
Chiral sum-frequency generation (SFG) has proven to be a versatile spectroscopic and imaging tool for probing chirality. However, due to polarization restriction, the conventional chiral SFG microscopes have mostly adopted noncollinear beam configurations, which only partially cover the aperture of microscope and strongly spoil the spatial resolution. In this study, we report the first experimental demonstration of collinear chiral SFG microscopy, which fundamentally supports diffraction-limited resolution. This advancement is attributed to the collinear focus of a radially polarized vectorial beam and a linearly polarized (LP) beam. The tightly focused vectorial beam has a very strong longitudinal component, which interacts with the LP beam and produces the chiral SFG. The collinear configuration can utilize the full aperture and thus push the spatial resolution close to the diffraction limit. This technique can potentially boost the understanding of chiral systems.
chiral sum-frequency generation radially polarized beam nonlinear optical microscopy Advanced Photonics Nexus
2024, 3(2): 026006
光子学报
2023, 52(11): 1110004
1 合肥工业大学仪器科学与光电工程学院，安徽 合肥，230009
2 中国科学院微电子研究所光电中心，北京 100029
3 长春理工大学光电工程学院，吉林 长春，130022
4 北京航空航天大学仪器科学与光学工程学院，北京 100191
微/纳米尺度亚表面缺陷会降低光学元件等透明样品的物理特性，严重影响光学及半导体领域加工制造技术的发展。为了快速、无损检测透明样品亚表面缺陷，本文针对光学元件亚表面内微米量级缺陷的检测需求，提出了一种基于过焦扫描光学显微镜（TSOM）的检测方法。利用可见光光源显微镜和精密位移台，沿光轴对亚表面缺陷进行扫描，得到亚表面缺陷的一系列光学图像。将采集到的图像按照空间位置进行堆叠，生成TSOM图像。通过获得所测特征的最大灰度值来获得亚表面缺陷的定位信息。提出方法对2000 μm深亚表面缺陷的定位相对标准差达到0.12%。该研究为透明样品亚表面缺陷检测及其深度定位提供了一种新方法。
亚表面缺陷 缺陷检测 过焦扫描光学显微镜 深度定位 光学学报
2023, 43(21): 2112001
Author Affiliations
Abstract
University of Shanghai for Science and Technology, Terahertz Technology Innovation Research Institute, Terahertz Spectrum and Imaging Technology Cooperative Innovation Center, Shanghai Key Lab of Modern Optical System, Shanghai, China
We review the recent biomedical detection developments of scanning near-field optical microscopy (SNOM), focusing on scattering-type SNOM, atomic force microscope-based infrared spectroscopy, peak force infrared microscopy, and photo-induced force microscopy, which have the advantages of label-free, noninvasive, and specific spectral recognition. Considering the high water content of biological samples and the strong absorption of water by infrared waves, we divide the relevant research on these techniques into two categories: one based on a nonliquid environment and the other based on a liquid environment. In the nonliquid environment, the chemical composition and structural information of biomedical samples can be obtained with nanometer resolution. In the liquid environment, these techniques can be used to monitor the dynamic chemical reaction process and track the process of chemical composition and structural change of single molecules, which is conducive to exploring the development mechanism of physiological processes. We elaborate their experimental challenges, technical means, and actual cases for three microbiomedical samples (including biomacromolecules, cells, and tissues). We also discuss the prospects and challenges for their development. Our work lays a foundation for the rational design and efficient use of near-field optical microscopy to explore the characteristics of microscopic biology.
near-field scattering-type scanning near-field optical microscopy atomic force microscope-based infrared spectroscopy photo-induced force microscopy biomedical detection nanospectroscopy Advanced Photonics Nexus
2023, 2(4): 044002
Author Affiliations
Abstract
1 State Key Laboratory of Surface Physics and Department of Physics, Human Phenome Institute, Academy for Engineering and Technology, Key Laboratory of Micro- and Nano-Photonic Structures (Ministry of Education), Fudan University, Shanghai 200433, P. R. China
2 Yiwu Research Institute, Fudan University, Chengbei Road, Yiwu, Zhejiang 322000, P. R. China
Benefiting from the developments of advanced optical microscopy techniques, the mysteries of biological functions at the cellular and subcellular levels have been continuously revealed. Stimulated Raman scattering (SRS) microscopy is a rapidly growing technique that has attracted broad attentions and become a powerful tool for biology and biomedicine, largely thanks to its chemical specificity, high sensitivity and fast image speed. This review paper introduces the principles of SRS, discusses the technical developments and implementations of SRS microscopy, then highlights and summarizes its applications on biological cellular machinery and finally shares our visions of potential breakthroughs in the future.Benefiting from the developments of advanced optical microscopy techniques, the mysteries of biological functions at the cellular and subcellular levels have been continuously revealed. Stimulated Raman scattering (SRS) microscopy is a rapidly growing technique that has attracted broad attentions and become a powerful tool for biology and biomedicine, largely thanks to its chemical specificity, high sensitivity and fast image speed. This review paper introduces the principles of SRS, discusses the technical developments and implementations of SRS microscopy, then highlights and summarizes its applications on biological cellular machinery and finally shares our visions of potential breakthroughs in the future.
Nonlinear optical microscopy vibrational spectral imaging coherent Raman scattering biological cells Journal of Innovative Optical Health Sciences
2023, 16(2): 2230010
1 南京理工大学 电子工程与光电技术学院，南京 210094
2 上海市计量测试技术研究院，上海 201203
3 中国电子科技集团公司第十三研究所，石家庄 050051
从显微成像测量线宽的理论模型出发，分析了限制测量精度的边缘定位误差因素，基于阶跃边缘衍射光强微分的灵敏探测原理，提出一种平移差分的微结构线宽显微测量方法，即使用压电陶瓷微位移平台微量移动待测微结构沟槽，两步平移并采集三幅对沟槽清晰成像的显微图像，显微图像依次相减得到两幅差分图，将线宽测量转为差分脉冲距离测量，利用差分脉冲在阶跃边缘附近梯度变化灵敏度高的特点，突破衍射极限，提高线宽测量精度；再用纳米精度压电陶瓷位移台标定与显微成像系统有关的倍率测量常数，以压电陶瓷位移台的高精度保证测量结果的准确性。以可溯源计量部门、线宽为30.00 μm的标准沟槽样板作为待测样品，10次测量得到线宽测量平均值30.03 μm，标准差0.005 μm，并对本方法进行了不确定度分析，最终得到合成不确定度为0.37%（）。
线宽测量 光学显微 平移差分 测量精度 衍射极限 Linewidth measurement Optical microscopy Translation difference Precision Diffraction limit 
