典型卫星轨道辐射环境及在轨软错误率预计模型分析
[1] Binder D, Smith E C, Holman A B. Satellite anomalies from galactic cosmic rays[J]. IEEE Trans on Nucl Sci, 1975, 22(6): 2675-2680.
[2] Bedingfield K L, Leach R D, Alexander M B. Spacecraft system failures and anomalies attributed to the natural space environment[R]. NASA Reference Publication 1390, 1996.
[3] Ecoffet R. On-orbit anomalies: Investigations and root cause determination[C]//IEEE NSREC 2011 Short Course Notes, Section IV. 2011.
[4] Dodd P, Shaneyfelt M, Schwank J, et al. Current and future challenges in radiation effects on CMOS electronics[J]. IEEE Trans on Nucl Sci, 2010, 57(4): 1747-1763.
[5] 罗尹虹, 张凤祁, 郭红霞, 等. 纳米DDR SRAM器件重离子单粒子效应试验研究[J]. 强激光与粒子束, 2013, 25(10): 2705-2710.
[6] Space Radiation Associates. Space radiation[DB/OL]. http://www.spacerad.com/.2013.
[7] 薛玉雄, 曹洲, 杨世宇, 等. 基于Space Radiation 5.0软件平台分析典型GEO空间辐射环境[J]. 航天器环境工程, 2007, 24(5): 291-295.
Xue Yuxiong, Cao Zhou, Yang Shiyu, et al. Analyses of typical GEO space radiation environment using software package Space Radiation 5.0. Spacecraft Environment Engineering, 2007, 24(5): 291-295
[8] Pickel J C, Blandford J T. Cosmic ray induced errors in MOS memory cells[J]. IEEE Trans on Nucl Sci, 1978, 25(6): 1166-1171.
[9] Edmonds L D. A distribution function for double-bit upsets[J]. IEEE Trans on Nucl Sci, 1989, 36(2): 1344-1346.
[10] Zhang Zhangang, Liu Jie, Hou Mingdong, et al. Large energy-loss straggling of swift heavy ions in ultra-thin active silicon layers[J]. Chin Phys B, 2013, 22: 096103.
[11] Petersen E L, Pickel J C, Adams J H, et al. Rate prediction for single event effects—a critique[J]. IEEE Trans on Nucl Sci, 1992, 39(6): 1577-1599.
[12] Petersen E L, Pickel J C, Smith E C, et al. Geometrical factors in SEE rate calculations[J]. IEEE Trans on Nucl Sci, 1993, 40(6): 1888-1909.
[13] Pickel J C. Single-event effects rate prediction[J]. IEEE Trans on Nucl Sci, 1996, 43(2): 483-495.
[14] Tang H H. SEMM-2: A new generation of single-event-effect modeling tools[J]. IBM Jour Res Dev, 2008, 52(3): 233-244.
[15] Tang H H, Cannon E H. SEMM-2: a modeling system for single event upset analysis[J]. IEEE Trans on Nucl Sci, 2004, 51(6): 3342-3348.
[16] Weller R A, Mendenhall M H, Reed R A, et al. Monte Carlo simulation of single event effects[J]. IEEE Trans on Nucl Sci, 2010, 57(4): 1726-1746.
[17] Raine M, Hubert G, Gaillardin M, et al. Monte Carlo prediction of heavy ion induced MBU sensitivity for SOI SRAMs using radial ionization profile[J]. IEEE Trans on Nucl Sci, 2011, 58(6): 2607-2613.
[18] Adams J H, Barghouty A F, Mendenhall M H, et al. CREME: The 2011 revision of the cosmic ray effects on micro-electronics code[J]. IEEE Trans on Nucl Sci, 2012, 59(6): 3141-3147.
张战刚, 雷志锋, 恩云飞. 典型卫星轨道辐射环境及在轨软错误率预计模型分析[J]. 强激光与粒子束, 2015, 27(9): 094002. Zhang Zhan’gang, Lei Zhifeng, En Yunfei. Radiation environment of typical satellite orbits and on-orbit soft error rate prediction model analysis[J]. High Power Laser and Particle Beams, 2015, 27(9): 094002.