激光与光电子学进展, 2012, 49 (8): 080005, 网络出版: 2012-05-23   

图形化蓝宝石衬底技术综述 下载: 1481次

Patterned Sapphire Substrate Technique: A Review
作者单位
中国科学院微电子研究所 中国科学院微电子器件与集成技术重点实验室, 北京 100029
摘要
采用图形化蓝宝石衬底(PSS)技术可以降低GaN外延层材料位错密度,提高了发光二极管(LED)的内量子效率(IQE),同时使LED光析出率(LEE)提高。基于PSS技术可以制作高效GaN基高亮度LED。基于已公开发表文献对用于高效LED制作的PSS技术做了综述,介绍了PSS技术演化、PSS的制作方法与主要的图形结构、PSS上GaN外延层生长机制以及PSS对LED性能的影响。PSS结构对LED的IQE与LEE均有提高,但对二者哪个提高更为有效没有定论,最近的研究结果倾向于以为对LEE提高更为有效。PSS对LED的IQE与LEE提高的机制目前并不是非常清楚,对公开发表的PSS对LEE的提高机制提出了不同看法。不同PSS结构与尺寸对GaN质量以及LED性能的影响方面的研究目前还非常缺乏。
Abstract
Based on patterned sapphire substrate (PSS) technique, threading dislocations density (TD) in GaN epilayer can be reduced and the internal quantum efficiency (IQE) as well as light extraction efficiency (LEE) of light emitting diode (LED) can be improved. Highly efficient LED based on GaN can be grown on patterned sapphire substrate. A review of PSS technique is given based on published papers, including the development of PSS technique, its fabrication and pattern structure, process of GaN epilayer growth and performance improvement of LED on PSS. IQE and LEE can both be improved by PSS, but it is unknown that improvement from IQE or LEE achieved by PSS is essential. The mechanism of improvement of IQE and LEE is not very clear, while arguments about the mechanism proposed by published papers are given. The effects of different PSS structures and sizes on the quality of GaN and performance of LED are not well investigated yet.
参考文献

[1] E. F. Schubert, J.K. Kim. Solid-state light sources getting smart[J]. Science, 2005, 308(5726): 1274~1278

[2] S. Nakamura, G. Fasol, S. J. Pearton. The Blue Laser Diode: the Complete Story[M]. Berlin: Springer Verlag, 2000

[3] Y. Narukawa, J. Narita, T. Sakamoto et al.. Ultra-high efficiency white light emitting diodes[J]. Jpn. J. Appl. Phys., 2006, 45(37-41): L1084~L1086

[4] 刘翠萍, 于佳, 黎旭艳 等. LED用于彩色全息图照明的色度研究[J]. 光子学报, 2012, 41(2): 218~221

    Liu Cuiping, Yu Jia, Li Xuyan et al.. Colorimetrical research on LED displaying color holograms[J]. Acta Photonica Sinica, 2012, 41(2): 218~221

[5] 李林, 王光珍, 王丽莉 等. 实现均匀照明的LED系统设计方法[J]. 光学学报, 2012, 32(2): 0222002

    Li Lin, Wang Guangzhen, Wang Lili et al.. Lens design for uniform illumination with LED[J]. Acta Optica Sinica, 2012, 32(2): 0222002

[6] 林慧川, 陶华, 贺盟 等. 大功率单色LED的空间相干特性[J]. 光学学报, 2012, 32(3): 0323003

    Lin Huichuan, Tao Hua, He Meng et al.. Spatial coherence of high-power single-color LED[J]. Acta Optica Sinica, 2012, 32(3): 0323003

[7] 肖思, 李林. 大功率LED舞台灯的照明设计[J]. 光学学报, 2011, 31(S1): s100307

    Xiao Si, Li Lin. A designing of LED stage lighting for long distance[J]. Acta Optica Sinica, 2011, 31(S1): s100307

[8] 黄鸿勇, 郭志友, 叶国光 等. 图形衬底参数对LED发光效率的影响[J]. 光学学报, 2011, 31(S1): s100416

    Huang Hongyong, Guo Zhiyou, Ye Guoguang et al.. Influence of patterned substrate parameters on luminous efficiency of LED[J]. Acta Optica Sinica, 2011, 31(S1): s100416

[9] Seong-Muk Jeong, Suthan Kissinger, Dong-Wook Kim et al.. Characteristic enhancement of the blue LED chip by the growth and fabrication on patterned sapphire (0001) substrate[J]. J. Cryst. Growth, 2010, 312(2): 258~262

[10] Yi-Jung Liu, Tsung-Yuan Tsai, Chih-Hung Yen et al.. Performance investigation of GaN-based light-emitting diodes with tiny misorientation of sapphire substrates[J]. Opt. Express, 2010, 18(3): 2729~2742

[11] Pekka Trm. Approaches for Optimizing Light Emitting Diode Structures Based on III-N Materials[D]. Espoo: Aalto University, 2011. 7~8

[12] X. A. Cao, J. A. Teetsov, F. Shahedipour-Sandvik et al.. Microstructural origin of leakage current in GaN/InGaN light-emitting diodes[J]. J. Cryst. Growth, 2004, 264(1-3): 172~177

[13] A. Billeb, W. Grieshaber, D. Stocker et al.. Microcavity effects in GaN epitaxial films and in Ag/GaN/sapphire structures[J]. Appl. Phys. Lett., 1997, 70(21): 2790~2792

[14] T. Fujii, Y. Gao, R. Sharma et al.. Increase in the extraction efficiency of GaN-based light-emitting diodes via surface roughening[J]. Appl. Phys. Lett., 2004, 84(6): 855~857

[15] S. J. Chang, Y. C. Lin, Y. K. Su et al.. Nitride-based LEDs fabricated on patterned sapphire substrates[J]. Solid-State Electronics, 2003, 47(9): 1539~1542

[16] Kazuyuki Tadatomo, Hiroaki Okagawa, Youichiro Ohuchi et al.. High output power near-ultraviolet and violet light-emtting diodes fabricated on patterned sapphire substrates using metalorganic vapor phase epitxy[J]. J. Light & Vis. Env., 2003, 27(3): 140~145

[17] 彭冬生, 冯玉春, 牛憨笨. MOCVD法横向外延过生长GaN薄膜[J]. 电子元件与材料, 2009, 28(2): 66~69

    Peng Dongsheng, Feng Yuchun, Niu Hanben. Lateral epitaxial overgrowth GaN thin film with MOCVD[J]. Electronic Components and Materials, 2009, 28(2): 66~69

[18] Yoshiki Kato, Shota Kitamura, Kazumasa Hiramatsu et al.. Selective growth of wurtzite GaN and AlxGa1-xN on GaN/sapphire substrates by metalorganic vapor phase epitaxy[J]. J. Cryst. Growth, 1994, 144(3-4): 133~140

[19] A. Sakai, H. Sunakawa, A. Usui. Defect structure in selectively grown GaN films with low threading dislocation density[J]. Appl. Phys. Lett., 1997, 71(16): 2259~2261

[20] Ok-Hyun Nam, Michael D. Bremser, Tsvetanka S. Zheleva et al.. Lateral epitaxy of low defect density GaN layers via organometallic vapor[J]. Appl. Phys. Lett., 1997, 71(18): 2638~2640

[21] Kazumasa Hiramatsu, Katsuya Nishiyama, Masaru Onishi et al.. Fabrication and characterization of low defect density GaN using facet-controlled epitaxial lateral overgrowth (FACELO)[J]. J. Cryst. Growth, 2000, 221(1-4): 316~326

[22] Y. K. Su, J. J. Chen, C. L. Lin et al.. Pattern-size dependence of characteristics of nitride-based LEDs grown on patterned sapphire substrates[J]. J. Cryst. Growth, 2009, 311(10): 2973~2976

[23] Ok-Hyun Nam, Tsvetanka S. Zheleva, Mchael D. bremser et al.. Lateral epitaxial overgrowth of GaN films on SiO2 areas via metalorganic vapor phase epitaxy[J]. J. Electron. Mater., 1998, 27(4): 233~237

[24] Carol I. H. Ashby, Christine C. Mitchell, Jung Han et al.. Low-dislocation-density GaN from a single growth on a textured substrate[J]. Appl. Phys. Lett., 2000, 77(20): 3233~3235

[25] Ji-Hao Cheng, Yew Chung Sermon Wu, Wei-Chih Liao et al.. Improved crystal quality and performance of GaN-based light-emitting diodes by decreasing the slanted angle of patterned sapphire[J]. Appl. Phys. Lett., 2010, 96(5): 051109

[26] Eun-Hyun Park, Jin Jang, Shalini Gupta et al.. Air-voids embedded high efficiency InGaN-light emitting diode[J]. Appl. Phys. Lett., 2008, 93(19): 191103

[27] Chang-Chi Pan, Chi-Hsun Hsieh, Chih-Wei Lin et al.. Light output improvement of InGaN ultraviolet light-emitting diodes by using wet-etched stripe-patterned sapphire substrates[J]. J. Appl. Phys., 2007, 102(8): 084503

[28] Tae Sun Kim, Sang-Mook Kim, Yun Hee Jang et al.. Increase of light extraction from GaN based light emitting diodes incorporating patterned structure by colloidal lithography[J]. Appl. Phys. Lett., 2007, 91(17): 171114

[29] D. W. Kim, C. H. Jeong, K. N. Kim et al.. High rate sapphire (Al2O3) etching in inductively coupled plasmas using axial external magnetic field[J]. Thin Solid Films, 2003, 435(1-2): 242~246

[30] Z. H. Feng, Y. D. Qi, Z. D. Lu et al.. GaN-based blue light-emitting diodes grown and fabricated on patterned sapphire substrates by metalorganic vapor-phase epitaxy[J]. J. Cryst. Growth, 2004, 272(1-4): 327~332

[31] 薛小琳, 韩彦军一, 张贤鹏 等. 基于BCI3感应耦合等离子体的蓝宝石光滑表面刻蚀[J]. 光电子学·激光, 2007, 18(9): 1078~1081

    Xue Xiao-lin, Han Yan-jun, Zhang Xian-peng et al.. Smooth etching of sapphire wafers using BCl3 inductively coupled plasmas[J]. J. Optoelectronics·Laser, 2007, 18(9): 1078~1081

[32] Haiyong Gao, Fawang Yan, Yang Zhang et al.. Enhancement of the light output power of InGaN/GaN light-emitting diodes grown on pyramidal patterned sapphire substrates in the micro- and nanoscale[J]. J. Appl. Phys., 2008, 103(1): 014314

[33] Suthan Kissinger, Seong-Muk Jeong, Seok-Hyo Yun et al.. Enhancement in emission angle of the blue LED chip fabricated on lens patterned sapphire (0001)[J]. Solid-State Electronics, 2010, 54(5): 509~515

[34] Haiyong Gao, Fawang Yan, Yang Zhang et al.. Improvement of the performance of GaN-based LEDs grown on sapphire substrates patterned by wet and ICP etching[J]. Solid-State Electronics, 2008, 52(6): 962~967

[35] Chia-Ta Chang, Shih-Kuang Hsiao, Edward Yi Chang et al.. 460-nm InGaN-based LEDs grown on fully inclined hemisphere-shape-patterned sapphire substrate with submicrometer spacing[J]. IEEE Photon. Technol. Lett., 2009, 21(19): 1366~1368

[36] Haiyong Gao, Fawang Yan, Yang Zhang et al.. Fabrication of nano-patterned sapphire substrates and their application to the improvement of the performance of GaN-based LEDs[J]. J. Phys. D: Appl. Phys., 2008, 41(11): 115106

[37] Y. P. Hsu, S.J. Chang, Y. K. Su et al.. ICP etching of sapphire substrates[J]. Opt. Mater., 2005, 27(6): 1171~1174

[38] Dong-Sing Wuu, Hsueh-Wei Wu, Shih-Ting Chen et al.. Defect reduction of laterally regrown GaN on GaN/patterned sapphire substrates[J]. J. Cryst. Growth, 2009, 311(10): 3063~3066

[39] Jing Wang, L. W. Guo, H. Q. Jia et al.. Investigation of characteristics of laterally overgrown GaN on stripe sapphire substrates patterned by wet chemical etching[J]. J. Cryst. Growth, 2006, 290(2): 398~404

[40] C. H. Jeong, D. W. Kim, J. W. Bae et al.. Dry etching of sapphire substrate for device separation in chlorine-based inductively coupled plasmas[J]. Mater. Sci. Engng. B, 2002, 93(1-3): 60~63

[41] Chang Hyun Jeong, Dong Woo Kim, Kyong Nam Kim et al.. A study of sapphire etching characteristics using BCl3-based inductively coupled plasmas[J]. Jpn. J. Appl. Phys., 2002, 41(10): 6206~6208

[42] Seong-Mo Koo, Dong-Pyo Kim, Kyoung-Tae Kim et al.. The etching properties of Al2O3 thin films in N2/Cl2/BCl3 and Ar/Cl2/BCl3 gas chemistry[J]. Mater. Sci. Engng. B, 2005, 118(1-3): 201~204

[43] C. H. Jeong, D. W. Kim, H. Y. Lee et al.. Sapphire etching with BCl3/HBr/Ar plasma[J]. Surf. Coat. Technol., 2003, 171(1-3): 280~284

[44] L. A. Marasina, V. V. Malinovsky, I. G. Pichugin et al.. Chemical etching of sapphire[J]. Cryst. Res. Technol., 1982, 17(3): 365~371

[45] F. Dwikusuma, D. Saulys, T.F. Kuecha. Study on sapphire surface preparation for III-nitride heteroepitaxial growth by chemical treatments[J]. J. Electroc. Soc., 2002, 149(11): G603~G608

[46] Y. J. Lee, J. M. Hwang, T. C. Hsu et al.. Enhancing the output power of GaN-based LEDs grown on wet-etched patterned sapphire substrates[J]. IEEE Phpton. Technol. Lett., 2006, 18(10): 1152~1154

[47] S. J. Kim. Vertical electrode GaN-based light-emitting diode fabricated by selective wet etching technique[J]. Jpn. J. Appl. Phys., 2005, 44(1): 2921~2924

[48] Y. J. Lee, T. C. Hsu, H. C. Kuo et al.. Improvement in light-output efficiency of near-ultraviolet InGaN-GaN LEDs fabricated on stripe patterned sapphire substrates[J]. Mater. Sci. Engng. B, 2005, 122(3): 184~187

[49] Y. P. Hsu, S. J. Chang, Y. K. Su et al.. Lateral epitaxial patterned sapphire InGaN/GaN MQW LEDs[J]. J. Cryst. Growth, 2004, 261(4): 466~470

[50] J. W. Kim, Y. C. Kim, W. J. Lee et al.. Reactive ion etching mechanism of plasma enhanced chemically vapor deposited aluminum oxide film in CF4/O2 plasma[J]. J. Appl. Phys., 1995, 78(3): 2045~2049

[51] 迈克尔·A. 力伯曼,阿伦·J. 里登伯格. 等离子体放电原理与材料处理[M]. 蒲以康 译. 北京:科学出版社, 2007. 291~435

    Michael A. Lieberman, Allan J. Lichtenberg. Principles of Plasma Discharges and Materials Processing(Second Edition)[M]. Pu Yikang Transl.. Beijing: Science Press, 2007. 291~435

[52] A. Bell, R. Liu, F. A. Ponce et al.. Light emission and microstructure of Mg-doped AlGaN grown on patterned sapphire[J]. Appl. Phys. Lett., 2003, 82(3): 349~351

[53] C. Cardinaud, M. C. Peignon, P. Y. Tessier. Plasma etching: principles, mechanisms, application to micro- and nano-technologies[J]. Appl. Surf. Sci., 2002, 164(1-4): 72~83

[54] P. C. Tsai, R. W. Chuang, Y. K. Su. Lifetime tests and junction-temperature measurement of InGaN light-emitting diodes using patterned sapphire substrates[J]. J. Lightwave Technol., 2007, 25(2): 591~596

[55] J. C. Song, S. H. Lee, I. H. Lee et al.. Characteristics comparison between GaN epilayers grown on patterned and unpatterned sapphire substrate (0001)[J]. J. Cryst. Growth, 2007, 308(2): 321~324

[56] H. W. Huang, J. K. Huang, C. H. Lin et al.. Efficiency improvement of GaN-based LEDs with a SiO2 nanorod array and a patterned sapphire substrate[J]. IEEE Electron Device Lett., 2010, 31(6): 582~584

[57] H. Y. Shin, S. K. Kwon, Y. I. Chang et al.. Reducing dislocation density in GaN films using a cone-shaped patterned sapphire substrate[J]. J. Cryst. Growth, 2009, 311(17): 4167~4170

[58] K. S. Lee, H. S. Kwack, J. S. Hwang et al.. Spatial correlation between optical properties and defect formation in GaN thin films laterally overgrown on cone-shaped patterned sapphire substrates[J]. J. Appl. Phys., 2010, 107(10): 103506

[59] H. W. Huang, C. H. Lin, J. K. Huang et al.. Investigation of GaN-based light emitting diodes with nano-hole patterned sapphire substrate (NHPSS) by nano-imprint lithography[J]. Mater. Sci. Eng. B, 2009, 164(2): 76~79

[60] D. S. Wuu, W. K. Wang, W. C. Shih et al.. Enhanced output power of near-ultraviolet InGaN-GaN LEDs grown on patterned sapphire substrates[J]. IEEE Photon. Technol. Lett., 2005, 17(2): 288~290

[61] J. J. Chen, Y. K. Su, C. L. Lin et al.. Enhanced output power of GaN-based LEDs with nano-patterned sapphire substrates[J]. IEEE Photon. Technol. Lett., 2008, 20(13): 1193~1195

[62] Y. K. Su, J. J. Chen, C. L. Lin et al.. GaN-based light-emitting diodes grown on photonic crystal-patterned sapphire substrates by nanosphere lithography[J]. Jpn. J. Appl. Phys., 2008, 47(8): 6706~6708

[63] K. Y. Zang, Y. D. Wang, S. J. Chua et al.. Nanoscale lateral epitaxial overgrowth of GaN on Si(111)[J]. Appl. Phys. Lett., 2005, 87(19): 193106

[64] Y. D. Wang, K. Y. Zang, S. J. Chua et al.. Improvement of microstructural and optical properties of GaN layer on sapphire by nanoscale lateral epitaxial overgrowth[J]. Appl. Phys. Lett., 2006, 88(21): 211908

[65] M. T. Wang, K. Y. Liao, Y. L. Li. Growth mechanism and strain variation of GaN material grown on patterned sapphire substrates with various pattern designs[J]. IEEE Photon. Technol. Lett., 2011, 23(14): 962~964

[66] W. K. Wang, D. S. Wuu, S. H. Lin et al.. Growth and characterization of InGaN-based light-emitting diodes on patterned sapphire substrates[J]. J. Phys. Chem. Solids, 2008, 69(2): 714~718

[67] T. V. Cuong, H. S. Cheong, H. G. Kim et al.. Enhanced light output from aligned micropit InGaN-based light emitting diodes using wet-etch sapphire patterning[J]. Appl. Phys. Lett., 2007, 90(13): 131107

[68] D. S. Wuu, W. K. Wang, K. S. Wen et al.. Defect reduction and efficiency improvement of near-ultraviolet emitters via laterally overgrown GaN on a GaN/patterned sapphire template[J]. Appl. Phys. Lett., 2006, 89(16): 161105

[69] Pei Xiaojiang, Guo Liwei, Wang Xiaohui et al.. Enhanced photoluminescence of InGaN/GaN green light-emitting diodes grown on patterned sapphire substrate[J]. Chin. Phys. Lett., 2009, 26(2): 028101

[70] S. D. Lester, F. A. Ponce, M. G. Craford et al.. High dislocation densities in high efficiency GaN-based light-emitting diodes[J]. Appl. Phys. Lett., 1995, 66(10): 1249~1251

[71] Q. Dai, M. F. Schubert, M. H. Kim et al.. Internal quantum efficiency and nonradiative recombination coefficient of GaInN/GaN multiple quantum wells with different dislocation densities[J]. Appl. Phys. Lett., 2009, 94(11): 111109

[72] Jeff Y. Tsao. Light Emitting Diodes (LEDs) for General Illumination: an OIDA Technology Roadmap Update 2002 [M]. Washington D. C.: Optoelectronics Industry Development Association, 2002. 34

[73] Tsung-Xian Lee, Ko-Fon Gao, Wei-Ting Chien et al.. Light extraction analysis of GaN-based light-emitting diodes with surface texture and/or patterned substrate[J]. Opt. Express, 2007, 15(11): 6670~6676

[74] 江洋, 罗毅, 汪莱 等. 柱状与孔状图形衬底对MOVPE生长GaN体材料及LED器件的影响[J]. 物理学报, 2009, 58(5): 3468~3473

    Jiang Yang, Luo Yi, Wang Lai et al.. Influence of pillar- and hole-patterned sapphire substrates on MOVPE grown GaN bulk and L ED structures[J]. Acta Physica Sinica, 2009, 58(5): 3468~3473

汪明刚, 杨威风, 胡冬冬, 李超波, 夏洋. 图形化蓝宝石衬底技术综述[J]. 激光与光电子学进展, 2012, 49(8): 080005. Wang Minggang, Yang Weifeng, Hu Dongdong, Li Chaobo, Xia Yang. Patterned Sapphire Substrate Technique: A Review[J]. Laser & Optoelectronics Progress, 2012, 49(8): 080005.

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