X射线荧光光谱法对玻璃上膜层厚度及成分含量的测定
[1] Funahashi M, Kuraoka M, Fujimura S, et al. Advance in X-ray Analysis, 2000, 43: 109.
[2] Parekh N S, Nieuwenhuizen C, Borstrok J J M, et al. Electrochem. Soc., 1991, 138: 1460.
[3] CHEN Jian-bang, ZHAO Yu-zhen, ZHAO Bo-ru(陈建邦, 赵玉珍, 赵柏茹). Application Spectral Analysis(应用光谱分析), 1990, 44: 826.
[4] Artz B E, Bomback J L. X-ray Spectrometry, 1982, 11: 51.
[5] Lyman P F, Sakat a O, Marasco D L, et al. Surf. Sci., 2000, 462: L594.
[6] Pootrmans J, Archipov V. Thin Film Solar Cells. New York, USA: John Wiley Sons, 2006. 142.
[7] WANG Bo, LIU Ping, LI Wei, et al(王波, 刘平, 李伟, 等). Materials Review A(材料导报A), 2011, 25(10): 54.
[8] PAN Hui-ping, BO Lian-kun, HUANG Tai-wu, et al(潘惠平, 薄连坤, 黄太武, 等). Acta Phys. Sin.(物理学报), 2012, 61(22): 228801.
梅燕, 马密霞, 聂祚仁. X射线荧光光谱法对玻璃上膜层厚度及成分含量的测定[J]. 光谱学与光谱分析, 2013, 33(12): 3408. MEI Yan, MA Mi-xia, NIE Zuo-ren. Determination of Film Thickness, Component and Content Based on Glass Surface by Using XRF Spectrometry[J]. Spectroscopy and Spectral Analysis, 2013, 33(12): 3408.