中国激光, 2003, 30 (2): 167, 网络出版: 2006-06-27
平晶谱仪谱线波长的直接标定
New Planar Crystal X-ray Spectrometer with Independent Wavelength Calibration Ability
光学技术与仪器 平晶谱仪 辅助光阑 X射线光谱学 激光等离子体 optical technique and instrument planar crystal spectrometer auxiliary diaphragm X-ray spectroscopy laser plasma
摘要
提出一种简便的新方法用以实现X射线平晶谱仪谱线波长的直接标定，只需在谱仪晶体表面加上一个特制的辅助光阑，即可在不知光源位置和没有任何参考谱线的情况下精确标定谱线的波长。
Abstract
A novel method of measuring absolute X ray wavelengths using an auxiliary diaphragm attached to the planar crystal, which can accurately determine wavelengths without any reference line and any information or special position.
参考文献
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刘智, 李儒新, 贾天卿, 邓蕴沛, 范品忠, 曾志男, 徐至展. 平晶谱仪谱线波长的直接标定[J]. 中国激光, 2003, 30(2): 167. 刘智, 李儒新, 贾天卿, 邓蕴沛, 范品忠, 曾志男, 徐至展. New Planar Crystal X-ray Spectrometer with Independent Wavelength Calibration Ability[J]. Chinese Journal of Lasers, 2003, 30(2): 167.
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