激光技术, 2010, 34 (5): 643, 网络出版: 2011-02-15   

532 nm激光对面阵和线阵CCD损伤效应实验研究

Experimental study on 532nm laser-induced failure of array and linear CCD
作者单位
1 四川大学 电子信息学院, 成都 610064
2 中国工程物理研究院 科技委, 绵阳 621900
引用该论文

廖海, 孙年春, 冯国英, 周传明. 532 nm激光对面阵和线阵CCD损伤效应实验研究[J]. 激光技术, 2010, 34(5): 643.

LIAO Hai, SUN Nian-chun, FENG Guo-ying, ZHOU Chuan-ming. Experimental study on 532nm laser-induced failure of array and linear CCD[J]. Laser Technology, 2010, 34(5): 643.

参考文献

[1] WANG Sh Y. Study on laser-induced CCD detector vulnerability and survivability and fussy synthetic evaluation on CCD jamming effects[D]. Changchun: Changchun Institute of Optics, Fine Machanics and Physics, Chinese Academy, Sciences, 2002:13-14(in Chinese).

[2] JIANG J J, LUO F, CHEN J G. Research on femtosecond laser induced damage to CCD [J]. High Power Laser and Particle Beams, 2005, 17(4): 515 -517(in Chinese).

[3] GUO Sh F, CHENG X A, FU X Q, et al. Failure of array CCD irradiated by high-repetitive femto-second laser[J]. High Power Laser and Particle Beams, 2007,19(11):1783-1786(in Chinese).

[4] ZHONG H R, LIU T H, LU Q Sh, et al. Analysis of threshold of laser damage in photoelectric detectors[J].Laser Journal, 2001, 22(4):1-5(in Chinese).

[5] ZHONG H R, LU Q Sh, WEN T F, et al. Review on the laser-induced damage mechanism of CCD detector[J]. High Power Laser and Particle Beams, 1998,10(4):537-542(in Chinese).

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[8] YOU M. Interaction of femtosecond laser pulses with transparent materials[D]. Xi’an: Xi’an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, 2005:35-40(in Chinese).

[9] . Study of transmission depth in film materials to heat radioactive wave[J]. Journal of Thermal Science and Technology, 2003, 2(3): 271-274.

[10] JIANG N, ZHANG Ch, NIU Y X, et al. Numerical simulation of pulsed laser induced damage on CCD arrays[J]. Laser & Infrared, 2008, 38(10):5001-5004(in Chinese).

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廖海, 孙年春, 冯国英, 周传明. 532 nm激光对面阵和线阵CCD损伤效应实验研究[J]. 激光技术, 2010, 34(5): 643. LIAO Hai, SUN Nian-chun, FENG Guo-ying, ZHOU Chuan-ming. Experimental study on 532nm laser-induced failure of array and linear CCD[J]. Laser Technology, 2010, 34(5): 643.

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