激光技术, 2010, 34 (5): 643, 网络出版: 2011-02-15
532 nm激光对面阵和线阵CCD损伤效应实验研究
Experimental study on 532nm laser-induced failure of array and linear CCD
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廖海, 孙年春, 冯国英, 周传明. 532 nm激光对面阵和线阵CCD损伤效应实验研究[J]. 激光技术, 2010, 34(5): 643. LIAO Hai, SUN Nian-chun, FENG Guo-ying, ZHOU Chuan-ming. Experimental study on 532nm laser-induced failure of array and linear CCD[J]. Laser Technology, 2010, 34(5): 643.