中国激光, 2019, 46 (9): 0904003, 网络出版: 2019-09-10
高斯光束照射下微米颗粒的后向散射测量与分析 下载: 922次
Measurement and Analysis on Backward Scattering of Microparticles Illuminated by Gaussian Beam
引用该论文
顾侃, 侯科良, 沈建琪. 高斯光束照射下微米颗粒的后向散射测量与分析[J]. 中国激光, 2019, 46(9): 0904003.
Gu Kan, Hou Keliang, Shen Jianqi. Measurement and Analysis on Backward Scattering of Microparticles Illuminated by Gaussian Beam[J]. Chinese Journal of Lasers, 2019, 46(9): 0904003.
顾侃, 侯科良, 沈建琪. 高斯光束照射下微米颗粒的后向散射测量与分析[J]. 中国激光, 2019, 46(9): 0904003. Gu Kan, Hou Keliang, Shen Jianqi. Measurement and Analysis on Backward Scattering of Microparticles Illuminated by Gaussian Beam[J]. Chinese Journal of Lasers, 2019, 46(9): 0904003.