中国激光, 2019, 46 (9): 0904003, 网络出版: 2019-09-10   

高斯光束照射下微米颗粒的后向散射测量与分析 下载: 921次

Measurement and Analysis on Backward Scattering of Microparticles Illuminated by Gaussian Beam
作者单位
上海理工大学理学院, 上海 200093
引用该论文

顾侃, 侯科良, 沈建琪. 高斯光束照射下微米颗粒的后向散射测量与分析[J]. 中国激光, 2019, 46(9): 0904003.

Gu Kan, Hou Keliang, Shen Jianqi. Measurement and Analysis on Backward Scattering of Microparticles Illuminated by Gaussian Beam[J]. Chinese Journal of Lasers, 2019, 46(9): 0904003.

参考文献

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顾侃, 侯科良, 沈建琪. 高斯光束照射下微米颗粒的后向散射测量与分析[J]. 中国激光, 2019, 46(9): 0904003. Gu Kan, Hou Keliang, Shen Jianqi. Measurement and Analysis on Backward Scattering of Microparticles Illuminated by Gaussian Beam[J]. Chinese Journal of Lasers, 2019, 46(9): 0904003.

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