强激光与粒子束, 2005, 17 (12): 1909, 网络出版: 2006-04-28  

采用EPR谱和TEM对YSZ单晶辐照损伤的研究

Study on irradiation damage of yttria-stabilized zirconia single crystals using ERP and TEM
作者单位
1 电子科技大学应用物理系,四川,成都,610054
2 四川大学物理系,四川,成都,610065
3 美国密西根大学核工程与放射科学系,安娜堡,MI,48109
摘要
利用电子顺磁共振(EPR)谱和透射电子显微镜(TEM)研究了YSZ单晶的辐照效应.200keV的Xe和400keV的Cs离子注入[111]取向的YSZ单晶中,注量均为5×1016cm-2.EPR结果表明辐照产生了共振吸收位置g‖=1.989 和 g⊥=1.869、对称轴为[111]的六配位Zr3+顺磁缺陷。Cs辐照产生了比Xe 离子辐照多约150倍的六配位Zr3+顺磁缺陷。两种样品的剖面电子显微分析表明没有发现非晶化转变,但是Cs离子辐照的样品在损伤集中区域产生了密度较高的缺陷。因此,EPR谱和电子显微观察均说明在相同离位损伤(约160 dpa)的情况下,Cs离子辐照比Xe 离子辐照产生了更多的缺陷。造成这一现象的原因是Cs离子是化学活性的而Xe 离子却是惰性的.
Abstract
Electron paramagnetic resonance(EPR) and cross-sectional transmission electron microscopy were used to study defect structure and radiated damage mechanism.Single crystal samples of cubic zirconia stabilized by 9.5 mol.% Y2O3(YSZ) were implanted with 200 keV Xe ions and 400 keV Cs ions up to a dose of 5×1016 cm-2,respectively.EPR spectra show the trigonal signal with g‖=1.989 and g⊥=1.869, which exhibites axial symmetry with [111] direction as symmetry axis composed of sixfold-coordinated Zr3+ sites. Peak-to-peak intensity (per unit volume) of Cs-ion irradiated YSZ is as about 150 time as that of Xe-ion irradiated YSZ, which indicates that the concentration of sixfold-coordinated Zr3+ defects produced by Cs-ion irradiation is far more than that of Xe-ion irradiated.The cross-sectional images of the irradiated samples show that the Cs-ion irradiation in YSZ produced more defect clusters than Xe-ion irradiation.
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祖小涛, 封向东, 雷雨, 朱莎, 王鲁闵. 采用EPR谱和TEM对YSZ单晶辐照损伤的研究[J]. 强激光与粒子束, 2005, 17(12): 1909. ZU Xiao-tao, FENG Xiang-dong, LEI Yu, ZHU Sha, WANG Lu-min. Study on irradiation damage of yttria-stabilized zirconia single crystals using ERP and TEM[J]. High Power Laser and Particle Beams, 2005, 17(12): 1909.

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