基于Ptychography的极紫外光刻投影物镜波像差检测技术
方伟, 唐锋, 王向朝, 朱鹏辉, 李杰, 孟泽江, 张恒. 基于Ptychography的极紫外光刻投影物镜波像差检测技术[J]. 光学学报, 2016, 36(10): 1012002.
Fang Wei, Tang Feng, Wang Xiangzhao, Zhu Penghui, Li Jie, Meng Zejiang, Zhang Heng. Measurement of Wavefront Aberration of Extreme Ultraviolet Lithographic Projection Lens Based on Ptychography[J]. Acta Optica Sinica, 2016, 36(10): 1012002.
[1] 袁琼雁, 王向朝. 国际主流光刻机研发的最新进展[J]. 激光与光电子学进展, 2007, 44(1): 57-64.
[2] Platt B C, Shack R. History and principles of Shack-Hartmann[J]. Journal of Refractive Surgery, 2001, 17(5): 573-577.
[3] Fujii T, Kougo J, Mizuno Y, et al. Portable phase measuring interferometer using Shack-Hartmann method[C]. SPIE, 2003, 5038: 726-732.
[4] Fujii T, Suzuki K, Mizuno Y, et al. Integrated projecting optics tester for inspection of immersion ArF scanner[C]. SPIE, 2006, 6152: 615237.
[5] Miyakawa R H. Wavefront metrology for high resolution optical systems[D]. Berkeley: University of California, 2011.
[6] van de Kerkhof M A, de Boeij W, Kok H, et al. Full optical column characterization of DUV lithographic projection tools[C]. SPIE, 2004, 5377: 1960-1970.
[7] 吴飞斌, 唐锋, 王向朝, 等. Ronchi剪切干涉光刻投影物镜波像差检测技术研究[J]. 中国激光, 2015, 42(3): 0308008.
[8] 吴飞斌, 唐锋, 王向朝, 等. Ronchi相移剪切干涉仪及其相位提取误差分析[J]. 光学学报, 2015, 35(6): 0612004.
[9] 李杰, 唐锋, 王向朝, 等. 光栅横向剪切干涉仪及其系统误差分析[J]. 中国激光, 2015, 41(5): 0508006.
Li Jie, Tang Feng, Wang Xiangzhao, et al. System errors analysis of grating lateral shearing interferometer[J]. Chinese J Lasers, 2015, 41(5): 0508006.
[10] Wojdyla A, Miyakawa R, Naulleau P. Ptychographic wavefront sensor for high-NA EUV inspection and exposure tools[C]. SPIE, 2014, 9048: 904839.
[11] Rodenburg J M, Faulkner H M L. A phase retrieval algorithm for shifting illumination[J]. Applied Physics Letters, 2004, 85(20): 4795-4797.
[12] Gerchberg R W, Saxton W O. A practical algorithm for the determination of phase from image and diffraction plane pictures[J]. Optik, 1972, 35(2): 237-250.
[13] Fienup J R. Phase retrieval algorithms: A comparison[J]. Applied Optics, 1982, 21(15): 2758-2769.
[15] 程君, 刘诚, 朱健强. 照明方式对PIE成像质量影响的研究[J]. 光学学报, 2014, 34(9): 0911004.
[16] Williams G J, Quiney H M, Dhal B B, et al. Fresnel coherent diffractive imaging[J]. Physical Review Letters, 2006, 97(2): 025506.
[17] Thibault P, Dierolf M, Menzel A, et al. High-resolution scanning X-ray diffraction microscopy[J]. Science, 2008, 321(5887): 379-382.
[18] Thibault P, Dierolf M, Bunk O, et al. Probe retrieval in ptychographic coherent diffractive imaging[J]. Ultramicroscopy, 2009, 109(4): 338-343.
[19] Maiden A M, Rodenburg J M. An improved ptychographical phase retrieval algorithm for diffractive imaging[J]. Ultramicroscopy, 2009, 109(10): 1256-1262.
[20] Voelz D G, Roggemann M C. Digital simulation of scalar optical diffraction: Revisiting chirp function sampling criteria and consequences[J]. Applied Optics, 2009, 48(32): 6132-6142.
[21] Rydberg C, Bengtsson J. Efficient numerical representation of the optical field for the propagation of partially coherent radiation with a specified spatial and temporal coherence function[J]. Journal of the Optical Society of America A, 2006, 23(7): 1616-1625.
[22] Bao P, Situ G. Lensless phase microscopy using phase retrieval with multiple illumination wavelengths[J]. Applied Optics, 2012, 51(22): 5486-5494.
[23] Fienup J R. Invariant error metrics for image reconstruction[J]. Applied Optics, 1997, 36(32): 8352-8357.
[24] Guizar-Sicairos M, Thuman S T, Fienup J R. Efficient subpixel image registration algorithms[J]. Optics Letters, 2008, 33(2): 156-158.
[25] Kuerz P, Boehm T, Dinger U, et al. Optics for EUV lithography[C]. International Symposium on EUV Technology, Praque, 2009.
方伟, 唐锋, 王向朝, 朱鹏辉, 李杰, 孟泽江, 张恒. 基于Ptychography的极紫外光刻投影物镜波像差检测技术[J]. 光学学报, 2016, 36(10): 1012002. Fang Wei, Tang Feng, Wang Xiangzhao, Zhu Penghui, Li Jie, Meng Zejiang, Zhang Heng. Measurement of Wavefront Aberration of Extreme Ultraviolet Lithographic Projection Lens Based on Ptychography[J]. Acta Optica Sinica, 2016, 36(10): 1012002.