基于双频正交光栅一维相移的相位测量偏折术研究

提出一种新的相移方法，该方法将原独立的水平和垂直一维正弦光栅集成为单幅正交正弦光栅图，再采用双频光栅相移方法，从而实现仅通过某一特定方向相移即可获取两正交相位分布，并进而计算出待测面的梯度分布并由梯度分布恢复待测表面面形。详细介绍了双频光栅相移方法，推导了相移方向与双频光栅相移的对应关系。在传统方法中，须独立投影或显示水平和垂直一维正弦光栅，且分别进行相移测量，因此共需2×N 幅图像(N≥3)；而在双频正交光栅相移方法中，最少需要5 幅图像。当采用机械相移时，传统方法需要二维相移机构，而该方法仅需一维相移机构，因此该方法具有成本低、测量速度快、结构简单等优点。实测的眼镜片结果，验证了该方法的可行性。

Abstract

Phase measuring deflectometry (PMD) needs the two components of the local surface gradient via a sequence of two orthogonal sinusoidal fringe patterns that have to be displayed and captured separately. A novel phase-shift technique by using the cross fringe pattern is introduced, in which a one-dimensional N-phase shift allows for the acquisition of the two orthogonal phases, with only N exposures instead of 2N exposures. Therefore, it makes PMD possible be implemented by a one- dimensional translation of the fringe pattern, instead of the common two-dimensional translation, which will be quite useful for certain applications.

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刘元坤, , 杨征, . 基于双频正交光栅一维相移的相位测量偏折术研究[J]. 中国激光, 2015, 42(3): 0308005. 刘元坤, Evelyn Olesch, 杨征, Gerd Hausler. A One-Dimensional Phase-Shift Technique Based on Dual-Frequency Crossed Fringe for Phase Measuring Deflectometry[J]. Chinese Journal of Lasers, 2015, 42(3): 0308005.

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