强激光与粒子束, 2011, 23 (8): 2229, 网络出版: 2011-09-20   

252Cf源和重离子加速器对FPGA的单粒子效应

Single event effects on FPGA of californium252 and heavy-ion accelerator
作者单位
1 电子科技大学 电子薄膜与集成器件国家重点实验室, 成都 610054
2 成都华微电子科技有限公司, 成都 610041
3 西北核技术研究所, 西安 710024
摘要
对10万门基于静态随机存储器的现场可编程门阵列(FPGA)分别在锎-252(252Cf)源和HI-13串列加速器下进行了单粒子效应试验研究,测试了静态单粒子翻转截面及发生单粒子闩锁的线性能量转移阈值,并对试验结果进行了等效性分析比较。试验结果表明:252Cf源引起的FPGA单粒子翻转截面比重离子加速器引起的约低1个数量级;使用252Cf源未能观测到该器件的单粒子闩锁现象,而使用重离子加速器可以测出该FPGA发生单粒子闩锁的线性能量转移阈值;在现代集成电路的宇航辐射效应地面模拟单粒子效应试验中,252Cf源不是理想的测试单粒子闩锁的辐射源。
Abstract
Single event effects(SEEs) test results on a static random access memory(SRAM)-based FPGA with 100 k system gates using californium-252 (252Cf) and the HI-13 tandem-accelerator are presented. The results including the static single event upset(SEU) cross-sections and the linear energy transfer(LET) threshold of single event latchup(SEL) were quantitatively compared and analyzed. The results showed that the SEU cross-sections using 252Cf were an order of magnitude less than the ones using the accelerator. SEL was not observed when the FPGA was exposed to the 252Cf, while SEL LET threshold could be measured when using the heavy-ion accelerator. Therefore, 252Cf is not an ideal radioactive source to test SEL of CMOS circuits fabricated with advanced technologies for experimental simulation of the space environment.
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范雪, 李平, 李威, 杨志明, 张斌, 郭红霞, 姚志斌. 252Cf源和重离子加速器对FPGA的单粒子效应[J]. 强激光与粒子束, 2011, 23(8): 2229. Fan Xue, Li Ping, Li Wei, Yang Zhiming, Zhang Bin, Guo Hongxia, Yao Zhibin. Single event effects on FPGA of californium252 and heavy-ion accelerator[J]. High Power Laser and Particle Beams, 2011, 23(8): 2229.

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