强激光与粒子束, 2013, 25 (2): 485, 网络出版: 2013-01-07
大规模集成电路抗辐射性能无损筛选方法
Nondestructive screening method for radiation hardened performance of large scale integration
基本信息
| DOI: | 10.3788/hplpb20132502.0485 |
| 中图分类号: | TN791 |
| 栏目: | 粒子束技术 |
| 项目基金: | -- |
| 收稿日期: | 2012-05-04 |
| 修改稿日期: | 2012-09-03 |
| 网络出版日期: | 2013-01-07 |
| 通讯作者: | 周东 (xishijiagei_wo@hotmail.com) |
| 备注: | -- |
周东, 郭旗, 任迪远, 李豫东, 席善斌, 孙静, 文林. 大规模集成电路抗辐射性能无损筛选方法[J]. 强激光与粒子束, 2013, 25(2): 485. Zhou Dong, Guo Qi, Ren Diyuan, Li Yudong, Xi Shanbin, Sun Jing, Wen Lin. Nondestructive screening method for radiation hardened performance of large scale integration[J]. High Power Laser and Particle Beams, 2013, 25(2): 485.
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